{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T08:07:16Z","timestamp":1729670836342,"version":"3.28.0"},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,12]]},"DOI":"10.1109\/ieem.2015.7385784","type":"proceedings-article","created":{"date-parts":[[2016,5,7]],"date-time":"2016-05-07T09:44:45Z","timestamp":1462614285000},"page":"928-931","source":"Crossref","is-referenced-by-count":0,"title":["Monitoring the frequency and magnitude of an event with a ratio chart"],"prefix":"10.1109","author":[{"given":"Y.","family":"Cheng","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Knoth","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Xie","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.2514\/3.57850"},{"key":"ref11","article-title":"A bivariate gamma probability distribution with application to gust modeling","volume":"82483","author":"smith","year":"1982","journal-title":"NASA Tech Memo"},{"key":"ref12","article-title":"Some properties of a five-parameter bivariate probability distribution","volume":"82550","author":"tubbs","year":"1983","journal-title":"NASA Tech Memo"},{"article-title":"Introduction to statistical quality control","year":"2007","author":"montgomery","key":"ref13"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1080\/03610920600728450"},{"key":"ref3","doi-asserted-by":"crossref","first-page":"55","DOI":"10.1080\/00224065.1998.11979819","article-title":"Designs of one-and two-sided exponential EWMA charts","volume":"30","author":"gan","year":"1998","journal-title":"J Qual Technol"},{"key":"ref6","first-page":"37","article-title":"A combined control scheme for monitoring the frequency and size of an attribute event","author":"liu","year":"2012","journal-title":"J Appl Stat"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1080\/00207540701689743"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1002\/hyp.259"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1080\/00207540701325082"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.2307\/1268761"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1080\/002075400189482"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2007.896651"}],"event":{"name":"2015 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)","start":{"date-parts":[[2015,12,6]]},"location":"Singapore, Singapore","end":{"date-parts":[[2015,12,9]]}},"container-title":["2015 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7378213\/7385591\/07385784.pdf?arnumber=7385784","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,9,7]],"date-time":"2019-09-07T11:38:03Z","timestamp":1567856283000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7385784\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,12]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/ieem.2015.7385784","relation":{},"subject":[],"published":{"date-parts":[[2015,12]]}}}