{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T04:30:31Z","timestamp":1730262631745,"version":"3.28.0"},"reference-count":20,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,12]]},"DOI":"10.1109\/ieem.2018.8607573","type":"proceedings-article","created":{"date-parts":[[2019,1,15]],"date-time":"2019-01-15T05:35:12Z","timestamp":1547530512000},"page":"1150-1154","source":"Crossref","is-referenced-by-count":0,"title":["Debugging Process Oriented Software Reliability Models and Their Goodness-of-Fit"],"prefix":"10.1109","author":[{"given":"Shinji","family":"Inoue","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shigeru","family":"Yamada","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","first-page":"3","article-title":"Two-dimensional software reliability modeling","author":"ishii","year":"2006","journal-title":"Proc 12th IEEE PRDC"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/PRDC.2013.55"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1137\/0906053"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1986.6312915"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1002\/scj.20350"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/s10479-015-1870-0"},{"journal-title":"Software Reliability","year":"2000","author":"pham","key":"ref16"},{"key":"ref17","first-page":"1","article-title":"A discrete Gompertz equation and a software reliability growth model","volume":"44","author":"satoh","year":"2000","journal-title":"IEICE -Trans Inf Syst"},{"journal-title":"Software Reliability Modeling — Fundamentals and Applications","year":"2013","author":"yamada","key":"ref18"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1985.232179"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2011.2134350"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2003.1183936"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCA.2006.889475"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.camwa.2005.11.022"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/s10479-015-1869-6"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1093\/ietfec\/e90-a.12.2891"},{"key":"ref2","doi-asserted-by":"crossref","DOI":"10.1007\/978-3-319-06674-5","author":"buchholz","year":"2014","journal-title":"Input Modeling with PhaseType Distributions and Markov Models — Theory and Applications"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.1974.1100705"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1587\/transfun.E98.A.2031"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1080\/03610929308831053"}],"event":{"name":"2018 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)","start":{"date-parts":[[2018,12,16]]},"location":"Bangkok","end":{"date-parts":[[2018,12,19]]}},"container-title":["2018 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8589962\/8607265\/08607573.pdf?arnumber=8607573","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,25]],"date-time":"2022-01-25T20:00:30Z","timestamp":1643140830000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8607573\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,12]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/ieem.2018.8607573","relation":{},"subject":[],"published":{"date-parts":[[2018,12]]}}}