{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,20]],"date-time":"2026-03-20T20:25:09Z","timestamp":1774038309467,"version":"3.50.1"},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2018,12,1]],"date-time":"2018-12-01T00:00:00Z","timestamp":1543622400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2018,12,1]],"date-time":"2018-12-01T00:00:00Z","timestamp":1543622400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,12]]},"DOI":"10.1109\/ieem.2018.8607587","type":"proceedings-article","created":{"date-parts":[[2019,1,15]],"date-time":"2019-01-15T10:35:12Z","timestamp":1547548512000},"page":"1342-1347","source":"Crossref","is-referenced-by-count":1,"title":["Two-dimensional Technology Profiling of Patent Portfolio"],"prefix":"10.1109","author":[{"given":"C.-H.","family":"Kuan","sequence":"first","affiliation":[{"name":"Graduate Institute of Patent, National Taiwan University of Science and Technology, Taipei, Taiwan R.O.C"}]},{"given":"W.-M.","family":"Tu","sequence":"additional","affiliation":[{"name":"Graduate Institute of Patent, National Taiwan University of Science and Technology, Taipei, Taiwan R.O.C"}]},{"given":"D.-Z.","family":"Chen","sequence":"additional","affiliation":[{"name":"Dept. of Mechanical Engineering, Institute of Industrial Engineering National Taiwan University, Taiwan R.O.C"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1080\/10438599700000006"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.respol.2013.01.006"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/S0048-7333(02)00004-5"},{"key":"ref13","article-title":"Multi-dimensional comparative visualization for patent landscaping","author":"wittenburg","year":"2015","journal-title":"Proc Of BusinessVis Workshop"},{"key":"ref14","first-page":"523","article-title":"Software survey: VOSviewer, a computer program for bibliometric mapping","volume":"84","author":"eck","year":"2009","journal-title":"Scientometrics"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1017\/9781108565691"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s11192-009-0143-6"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/s11192-009-0039-5"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1002\/asi.20814"},{"key":"ref5","year":"1994"},{"key":"ref8","first-page":"984","article-title":"Technological Opportunity and Spillovers of R&D: Evidence from Firms Patents, Profits and Market Value","volume":"76","author":"jaffe","year":"1986","journal-title":"The American Economic Review"},{"key":"ref7","article-title":"The measurement of scientific and technological activities: using patent data as science and technology indicators","author":"schmoch","year":"1994","journal-title":"Patent Manual"},{"key":"ref2","year":"2017"},{"key":"ref1","year":"2012"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/0048-7333(89)90007-3"}],"event":{"name":"2018 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)","location":"Bangkok, Thailand","start":{"date-parts":[[2018,12,16]]},"end":{"date-parts":[[2018,12,19]]}},"container-title":["2018 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8589962\/8607265\/08607587.pdf?arnumber=8607587","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,3,21]],"date-time":"2023-03-21T19:48:05Z","timestamp":1679428085000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8607587\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,12]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/ieem.2018.8607587","relation":{},"subject":[],"published":{"date-parts":[[2018,12]]}}}