{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,21]],"date-time":"2025-08-21T18:40:18Z","timestamp":1755801618511,"version":"3.44.0"},"reference-count":11,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,12,1]],"date-time":"2019-12-01T00:00:00Z","timestamp":1575158400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,12,1]],"date-time":"2019-12-01T00:00:00Z","timestamp":1575158400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,12]]},"DOI":"10.1109\/ieem44572.2019.8978599","type":"proceedings-article","created":{"date-parts":[[2020,2,3]],"date-time":"2020-02-03T21:27:12Z","timestamp":1580765232000},"page":"405-410","source":"Crossref","is-referenced-by-count":0,"title":["A Decision Tool for Quality System Improvement"],"prefix":"10.1109","author":[{"given":"L.","family":"Picci","sequence":"first","affiliation":[{"name":"Ecole Polytechnique de Montreal,Department of Industrial Engineering,Canada"}]},{"given":"A. B.","family":"Mosbah","sequence":"additional","affiliation":[{"name":"Ecole Polytechnique de Montreal,Department of Industrial Engineering,Canada"}]},{"given":"S. J.","family":"Bassetto","sequence":"additional","affiliation":[{"name":"Ecole Polytechnique de Montreal,Department of Industrial Engineering,Canada"}]}],"member":"263","reference":[{"journal-title":"Introduction to Statistical Quality Control","year":"2011","author":"montgomery","key":"ref4"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.jlp.2008.07.011"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/CC.2014.7004533"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijpe.2008.10.017"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijpe.2017.10.016"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.2307\/2284859"},{"key":"ref8","article-title":"Vers La Maitrise de La Propagation Des Non-conformités En Fabrication. Cas D'étude Dans Une Usine D'assemblage Électromécanique","author":"fiegenwald","year":"2011","journal-title":"eme Conférence Internationale de Génie Industriel"},{"key":"ref7","first-page":"1","article-title":"Optimized Design of Control Plans Based on Risk Exposure and Resources Capabilities","author":"bettayeb","year":"2010","journal-title":"International Symposium on Semiconductor Manufacturing (ISSM)"},{"key":"ref2","article-title":"Failure mode and effects analysis (fmea): A guide for continuous improvement for the semi conductor equipment industry","author":"villacourt","year":"1992","journal-title":"International Sematech Inc"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1080\/00207543.2013.776187"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.1986.10488092"}],"event":{"name":"2019 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)","start":{"date-parts":[[2019,12,15]]},"location":"Macao, China","end":{"date-parts":[[2019,12,18]]}},"container-title":["2019 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8961317\/8978490\/08978599.pdf?arnumber=8978599","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,20]],"date-time":"2025-08-20T18:35:21Z","timestamp":1755714921000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8978599\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,12]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/ieem44572.2019.8978599","relation":{},"subject":[],"published":{"date-parts":[[2019,12]]}}}