{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T12:03:35Z","timestamp":1725710615060},"reference-count":12,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,12,18]],"date-time":"2023-12-18T00:00:00Z","timestamp":1702857600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,12,18]],"date-time":"2023-12-18T00:00:00Z","timestamp":1702857600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,12,18]]},"DOI":"10.1109\/ieem58616.2023.10406686","type":"proceedings-article","created":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T18:26:51Z","timestamp":1706812011000},"page":"1763-1767","source":"Crossref","is-referenced-by-count":0,"title":["Control Chart Pattern Recognition Based on MDWOP and Ensemble Classifier"],"prefix":"10.1109","author":[{"given":"Yazhou","family":"Li","sequence":"first","affiliation":[{"name":"School of Reliability and Systems Engineering, Beihang University,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yanyun","family":"Ma","sequence":"additional","affiliation":[{"name":"Aerospace Precision Products Co., Ltd,Tianjin,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wei","family":"Dai","sequence":"additional","affiliation":[{"name":"School of Reliability and Systems Engineering, Beihang University,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Weifang","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Reliability and Systems Engineering, Beihang University,Beijing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2022.108437"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3050355"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-019-01473-0"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-021-01907-8"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.cnsns.2016.01.011"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-023-10961-w"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.physa.2021.125997"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1098\/rsos.201011"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.3390\/machines11010115"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2020.106360"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.3390\/pr9091484"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s00500-022-06955-7"}],"event":{"name":"2023 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)","start":{"date-parts":[[2023,12,18]]},"location":"Singapore, Singapore","end":{"date-parts":[[2023,12,21]]}},"container-title":["2023 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10406295\/10406217\/10406686.pdf?arnumber=10406686","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,2]],"date-time":"2024-02-02T00:55:19Z","timestamp":1706835319000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10406686\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,12,18]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/ieem58616.2023.10406686","relation":{},"subject":[],"published":{"date-parts":[[2023,12,18]]}}}