{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T17:46:49Z","timestamp":1725472009331},"reference-count":0,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,7]]},"DOI":"10.1109\/igarss.2010.5651819","type":"proceedings-article","created":{"date-parts":[[2010,12,11]],"date-time":"2010-12-11T02:57:06Z","timestamp":1292036226000},"page":"xiii-xiii","source":"Crossref","is-referenced-by-count":0,"title":["Technical program overview"],"prefix":"10.1109","author":[{"given":"David","family":"Kunkee","sequence":"first","affiliation":[]},{"given":"Paolo","family":"Gamba","sequence":"additional","affiliation":[]}],"member":"263","event":{"name":"IGARSS 2010 - 2010 IEEE International Geoscience and Remote Sensing Symposium","start":{"date-parts":[[2010,7,25]]},"location":"Honolulu, HI, USA","end":{"date-parts":[[2010,7,30]]}},"container-title":["2010 IEEE International Geoscience and Remote Sensing Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5639672\/5648802\/05651819.pdf?arnumber=5651819","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T08:20:29Z","timestamp":1490084429000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5651819\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,7]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/igarss.2010.5651819","relation":{},"subject":[],"published":{"date-parts":[[2010,7]]}}}