{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,30]],"date-time":"2026-04-30T20:58:53Z","timestamp":1777582733735,"version":"3.51.4"},"reference-count":23,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,9,13]],"date-time":"2022-09-13T00:00:00Z","timestamp":1663027200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,9,13]],"date-time":"2022-09-13T00:00:00Z","timestamp":1663027200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,9,13]]},"DOI":"10.1109\/iicaiet55139.2022.9936831","type":"proceedings-article","created":{"date-parts":[[2022,11,9]],"date-time":"2022-11-09T20:44:15Z","timestamp":1668026655000},"page":"1-6","source":"Crossref","is-referenced-by-count":35,"title":["Classification of Defects in Robusta Green Coffee Beans Using YOLO"],"prefix":"10.1109","author":[{"given":"Vince Amiel M.","family":"Luis","sequence":"first","affiliation":[{"name":"School of Electrical, Electronics, and Computer Engineering, Mapúa University,Manila,Philippines"}]},{"given":"Marc Vincent T.","family":"Quinones","sequence":"additional","affiliation":[{"name":"School of Electrical, Electronics, and Computer Engineering, Mapúa University,Manila,Philippines"}]},{"given":"Analyn N.","family":"Yumang","sequence":"additional","affiliation":[{"name":"School of Electrical, Electronics, and Computer Engineering, Mapúa University,Manila,Philippines"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICIMTech50083.2020.9211257"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICIRD.2018.8376325"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.3390\/app9194195"},{"key":"ref13"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/HNICEM51456.2020.9400102"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/HNICEM51456.2020.9400004"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAR.2019.8813495"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ICCSSE52761.2021.9545163"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/HNICEM51456.2020.9400023"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICCSSE52761.2021.9545153"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/HNICEM51456.2020.9400144"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/HNICEM51456.2020.9400086"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICIRD.2018.8376326"},{"key":"ref5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.18494\/SAM.2021.3277"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICISPC.2019.8935644"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3390\/electronics10141711"},{"key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICAICTA.2017.8090980"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAE51876.2021.9426129"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ECTI-CON51831.2021.9454904"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/CAIBDA53561.2021.00043"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2966328"}],"event":{"name":"2022 IEEE International Conference on Artificial Intelligence in Engineering and Technology (IICAIET)","location":"Kota Kinabalu, Malaysia","start":{"date-parts":[[2022,9,13]]},"end":{"date-parts":[[2022,9,15]]}},"container-title":["2022 IEEE International Conference on Artificial Intelligence in Engineering and Technology (IICAIET)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9936688\/9936734\/09936831.pdf?arnumber=9936831","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,11,28]],"date-time":"2022-11-28T20:21:20Z","timestamp":1669666880000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9936831\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,9,13]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/iicaiet55139.2022.9936831","relation":{},"subject":[],"published":{"date-parts":[[2022,9,13]]}}}