{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,28]],"date-time":"2025-06-28T11:10:05Z","timestamp":1751109005333,"version":"3.41.0"},"reference-count":32,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,10]]},"DOI":"10.1109\/iiswc.2017.8167782","type":"proceedings-article","created":{"date-parts":[[2017,12,7]],"date-time":"2017-12-07T23:28:15Z","timestamp":1512689295000},"page":"250-260","source":"Crossref","is-referenced-by-count":4,"title":["Characterizing the impact of soft errors across microarchitectural structures and implications for predictability"],"prefix":"10.1109","author":[{"given":"Bagus","family":"Wibowo","sequence":"first","affiliation":[]},{"given":"Abhinav","family":"Agrawal","sequence":"additional","affiliation":[]},{"given":"James","family":"Tuck","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref32","first-page":"173","author":"xu","year":"2011","journal-title":"CriticalFault Amplifying Soft Error Effect Using Vulnerability-Driven Injection"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1145\/2975588"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2004.1311877"},{"key":"ref10","first-page":"72","author":"fang","year":"2016","journal-title":"SDC is in the Eye of the Beholder A Survey and Preliminary Study"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/MASCOTS.2006.18"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.2005.38"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/WWC.2001.990739"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/2150976.2150990"},{"key":"ref15","first-page":"1","author":"hari","year":"2012","journal-title":"Low-cost Program-level Detectors for Reducing Silent Data Corruptions ” ser DSN '12"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.2014.6853212"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/IISWC.2015.28"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/NANOARCH.2007.4400859"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2013.6653612"},{"key":"ref28","article-title":"Using hardware vulnerability tactors to enhance AVF analysis","author":"sridharan","year":"2010","journal-title":"Proceedings of the 37th Annual Intl Symp on Computer architecture ACM Request Permissions"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISPASS.2016.7482075"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2009.4798243"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2005.110"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/2897937.2897996"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1145\/1250662.1250726"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DSN-W.2017.16"},{"key":"ref8","article-title":"Intermittent faults in VLSI circuits","author":"constantinescu","year":"2007","journal-title":"Proc of Workshop on SELSE"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/2000064.2000067"},{"key":"ref2","article-title":"Quantized avf: A means of capturing vulnerability variations over small windows of time","author":"biswas","year":"0","journal-title":"SELSE'09 2009"},{"key":"ref9","first-page":"129","article-title":"Versatile prediction and fast estimation of Architectural Vulnerability Factor from processor performance metrics","author":"duan","year":"2009","journal-title":"HPCA 2009 IEEE 15th Intl Symp on"},{"key":"ref1","doi-asserted-by":"crossref","first-page":"280","DOI":"10.1080\/00031305.2000.10474560","article-title":"Simple and Effective Confidence Intervals for Proportions and Differences of Proportions Result from Adding Two Successes and Two Failures","volume":"54","author":"agresti","year":"2000","journal-title":"The American Statistician"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.2008.9"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2010.60"},{"key":"ref21","first-page":"23:1","author":"lu","year":"2014","journal-title":"SDCTune A Model for Predicting the SDC Proneness of an Application for Configurable Protection"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.2012.6237024"},{"key":"ref23","first-page":"29","article-title":"A systematic methodology to compute the architectural vulnerability factors for a high-performance microprocessor","author":"mukherjee","year":"2003","journal-title":"Microarchitecture 2003 MICRO-36 Proceedings 36th Annual IEEE\/ACM International Symposium on"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1145\/635508.605403"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1145\/1168857.1168869"}],"event":{"name":"2017 IEEE International Symposium on Workload Characterization (IISWC)","start":{"date-parts":[[2017,10,1]]},"location":"Seattle, WA","end":{"date-parts":[[2017,10,3]]}},"container-title":["2017 IEEE International Symposium on Workload Characterization (IISWC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8122074\/8167743\/08167782.pdf?arnumber=8167782","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,28]],"date-time":"2025-06-28T10:38:59Z","timestamp":1751107139000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8167782\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,10]]},"references-count":32,"URL":"https:\/\/doi.org\/10.1109\/iiswc.2017.8167782","relation":{},"subject":[],"published":{"date-parts":[[2017,10]]}}}