{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,15]],"date-time":"2026-05-15T11:17:04Z","timestamp":1778843824974,"version":"3.51.4"},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,5,1]],"date-time":"2021-05-01T00:00:00Z","timestamp":1619827200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,5,1]],"date-time":"2021-05-01T00:00:00Z","timestamp":1619827200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100000780","name":"European Union","doi-asserted-by":"publisher","award":["824164"],"award-info":[{"award-number":["824164"]}],"id":[{"id":"10.13039\/501100000780","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,5]]},"DOI":"10.1109\/imw51353.2021.9439608","type":"proceedings-article","created":{"date-parts":[[2021,5,31]],"date-time":"2021-05-31T22:40:32Z","timestamp":1622500832000},"page":"1-4","source":"Crossref","is-referenced-by-count":8,"title":["Modeling of oxide-based ECRAM programming by drift-diffusion ion transport"],"prefix":"10.1109","author":[{"given":"Matteo","family":"Baldo","sequence":"first","affiliation":[{"name":"Informazione e Bioingegneria (DEIB), Politecnico di Milano,Dipartimento di Elettronica,Milan,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Daniele","family":"Ielmini","sequence":"additional","affiliation":[{"name":"Informazione e Bioingegneria (DEIB), Politecnico di Milano,Dipartimento di Elettronica,Milan,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"crossref","DOI":"10.1126\/science.aaw5581","volume":"364","author":"fuller","year":"2019","journal-title":"Science"},{"key":"ref11","first-page":"35.7.1","author":"kim","year":"2019","journal-title":"IEDM Tech Dig"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1002\/adma.202003984"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1063\/1.370831"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1039\/C6TC01643J"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1039\/c3nr00476g"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2012.2202320"},{"key":"ref17","doi-asserted-by":"crossref","DOI":"10.1063\/1.3697690","volume":"100","author":"clima","year":"2012","journal-title":"Appl Phys Lett"},{"key":"ref18","first-page":"763","author":"wang","year":"2019","journal-title":"IEDM Tech Dig"},{"key":"ref19","author":"sze","year":"2012","journal-title":"Semiconductor Devices Physics and Technology"},{"key":"ref4","doi-asserted-by":"crossref","DOI":"10.1038\/s41586-018-0180-5","volume":"558","author":"ambrogio","year":"2018","journal-title":"Nature"},{"key":"ref3","doi-asserted-by":"crossref","DOI":"10.1038\/s41586-020-1942-4","volume":"577","author":"yao","year":"2020","journal-title":"Nature"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1002\/aisy.202000040"},{"key":"ref5","first-page":"6.5.1","author":"guo","year":"2017","journal-title":"IEDM Tech Dig"},{"key":"ref8","first-page":"13.1.1","author":"tang","year":"2018","journal-title":"IEDM Tech Dig"},{"key":"ref7","doi-asserted-by":"crossref","DOI":"10.1002\/adma.201604310","volume":"29","author":"fuller","year":"2017","journal-title":"Adv Mater"},{"key":"ref2","doi-asserted-by":"crossref","DOI":"10.1038\/s41928-018-0092-2","volume":"1","author":"ielmini","year":"2018","journal-title":"Nature Electronics"},{"key":"ref1","volume":"1","author":"zidan","year":"2018","journal-title":"Nature Electronics"},{"key":"ref9","doi-asserted-by":"crossref","DOI":"10.1038\/nmat4856","volume":"16","author":"van de burgt","year":"2017","journal-title":"Nat Mater"},{"key":"ref20","volume":"929","author":"agarwal","year":"2016","journal-title":"International Joint Conference on Neural Networks (IJCNN)"}],"event":{"name":"2021 IEEE International Memory Workshop (IMW)","location":"Dresden, Germany","start":{"date-parts":[[2021,5,16]]},"end":{"date-parts":[[2021,5,19]]}},"container-title":["2021 IEEE International Memory Workshop (IMW)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9439548\/9439588\/09439608.pdf?arnumber=9439608","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,8,2]],"date-time":"2022-08-02T23:53:44Z","timestamp":1659484424000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9439608\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,5]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/imw51353.2021.9439608","relation":{},"subject":[],"published":{"date-parts":[[2021,5]]}}}