{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,16]],"date-time":"2026-02-16T19:21:53Z","timestamp":1771269713743,"version":"3.50.1"},"reference-count":11,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,5,1]],"date-time":"2021-05-01T00:00:00Z","timestamp":1619827200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,5,1]],"date-time":"2021-05-01T00:00:00Z","timestamp":1619827200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,5,1]],"date-time":"2021-05-01T00:00:00Z","timestamp":1619827200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,5]]},"DOI":"10.1109\/imw51353.2021.9439613","type":"proceedings-article","created":{"date-parts":[[2021,5,31]],"date-time":"2021-05-31T22:40:32Z","timestamp":1622500832000},"page":"1-4","source":"Crossref","is-referenced-by-count":3,"title":["Hot Electron Source Side Injection Comprehension in 40nm eSTM\u2122"],"prefix":"10.1109","author":[{"given":"Franck","family":"Melul","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Thibault","family":"Kempf","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vincenzo","family":"della Marca","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Marc","family":"Bocquet","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Madjid","family":"Akbal","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Frederique","family":"Trenteseaux","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Marc","family":"Mantelli","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Arnaud","family":"Regnier","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Stephan","family":"Niel","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Francesco","family":"la Rosa","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","first-page":"1","author":"rosa","year":"2019","journal-title":"IEEE 11th IMW"},{"key":"ref3","first-page":"1","author":"masoero","year":"2012","journal-title":"IEEE IMW"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/16.469408"},{"key":"ref6","first-page":"741","author":"kamiya","year":"1982","journal-title":"IEEE IEDM"},{"key":"ref11","first-page":"65","author":"della marca","year":"2012","journal-title":"IEEE ISCDG"},{"key":"ref5","author":"howard","year":"0","journal-title":"Proc R Soc Lond"},{"key":"ref8","author":"takeda","year":"1995","journal-title":"Hot-Carrier Effects in MOS Devices"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/16.129096"},{"key":"ref2","first-page":"1","author":"strenz","year":"2020","journal-title":"IEEE IMW"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2014.07.063"},{"key":"ref1","first-page":"7.4.1","author":"niel","year":"2018","journal-title":"IEEE IEDM"}],"event":{"name":"2021 IEEE International Memory Workshop (IMW)","location":"Dresden, Germany","start":{"date-parts":[[2021,5,16]]},"end":{"date-parts":[[2021,5,19]]}},"container-title":["2021 IEEE International Memory Workshop (IMW)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9439548\/9439588\/09439613.pdf?arnumber=9439613","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,9]],"date-time":"2022-07-09T02:21:51Z","timestamp":1657333311000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9439613\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,5]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/imw51353.2021.9439613","relation":{},"subject":[],"published":{"date-parts":[[2021,5]]}}}