{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:07:21Z","timestamp":1740100041777,"version":"3.37.3"},"reference-count":8,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,5,1]],"date-time":"2021-05-01T00:00:00Z","timestamp":1619827200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,5,1]],"date-time":"2021-05-01T00:00:00Z","timestamp":1619827200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,5,1]],"date-time":"2021-05-01T00:00:00Z","timestamp":1619827200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100006602","name":"Air Force Research Laboratory (AFRL)","doi-asserted-by":"publisher","award":["FA8750-19-1-0014"],"award-info":[{"award-number":["FA8750-19-1-0014"]}],"id":[{"id":"10.13039\/100006602","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,5]]},"DOI":"10.1109\/imw51353.2021.9439618","type":"proceedings-article","created":{"date-parts":[[2021,5,31]],"date-time":"2021-05-31T22:40:32Z","timestamp":1622500832000},"page":"1-4","source":"Crossref","is-referenced-by-count":13,"title":["Optimization of Switching Metrics for CMOS Integrated HfO2 based RRAM Devices on 300 mm Wafer Platform"],"prefix":"10.1109","author":[{"given":"Jubin","family":"Hazra","sequence":"first","affiliation":[]},{"given":"Maximilian","family":"Liehr","sequence":"additional","affiliation":[]},{"given":"Karsten","family":"Beckmann","sequence":"additional","affiliation":[]},{"given":"Minhaz","family":"Abedin","sequence":"additional","affiliation":[]},{"given":"Sarah","family":"Rafq","sequence":"additional","affiliation":[]},{"given":"Nathaniel","family":"Cady","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","first-page":"1","article-title":"Improving the Memory Window\/Resistance Variability Trade-Off for 65nm CMOS Integrated HfO 2 Based Nanoscale RRAM Devices","author":"hazra","year":"0","journal-title":"2019 IEEE International Integrated Reliability Workshop (IIRW)"},{"key":"ref3","first-page":"554","article-title":"Stochastic variability of vacancy filament configuration in ultra-thin dielectrc RRAM and its impact on OFF-state reliability","author":"raghavan","year":"2013","journal-title":"Proc IEEE Int Electron Devices Meeting (IEDM)"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1016\/B978-0-08-102584-0.00002-4"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/LED.2013.2238883"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/TED.2012.2218607"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/LED.2017.2656818"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/IEDM.2016.7838429"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1186\/1556-276X-9-526"}],"event":{"name":"2021 IEEE International Memory Workshop (IMW)","start":{"date-parts":[[2021,5,16]]},"location":"Dresden, Germany","end":{"date-parts":[[2021,5,19]]}},"container-title":["2021 IEEE International Memory Workshop (IMW)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9439548\/9439588\/09439618.pdf?arnumber=9439618","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T15:41:48Z","timestamp":1652197308000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9439618\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,5]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/imw51353.2021.9439618","relation":{},"subject":[],"published":{"date-parts":[[2021,5]]}}}