{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T02:18:41Z","timestamp":1725761921969},"reference-count":7,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,5,12]],"date-time":"2024-05-12T00:00:00Z","timestamp":1715472000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,5,12]],"date-time":"2024-05-12T00:00:00Z","timestamp":1715472000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,5,12]]},"DOI":"10.1109\/imw59701.2024.10536955","type":"proceedings-article","created":{"date-parts":[[2024,5,24]],"date-time":"2024-05-24T17:19:11Z","timestamp":1716571151000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Comprehensive physics-based modeling of post-cycling long-term data retention in 176L 3-D NAND Flash Memories"],"prefix":"10.1109","author":[{"given":"Karansingh","family":"Thakor","sequence":"first","affiliation":[{"name":"Indian Institute of Technology Bombay,Department of Electrical Engineering,Mumbai,Maharashtra,India,400076"}]},{"given":"Nikhil","family":"Rangarajan","sequence":"additional","affiliation":[{"name":"Micron Technology, Singapore ; Hyderabad, India,San Jose,USA"}]},{"given":"Himanshu","family":"Diwakar","sequence":"additional","affiliation":[{"name":"Indian Institute of Technology Bombay,Department of Electrical Engineering,Mumbai,Maharashtra,India,400076"}]},{"given":"Rashmi","family":"Saikia","sequence":"additional","affiliation":[{"name":"Indian Institute of Technology Bombay,Department of Electrical Engineering,Mumbai,Maharashtra,India,400076"}]},{"given":"Tarun","family":"Samadder","sequence":"additional","affiliation":[{"name":"Indian Institute of Technology Bombay,Department of Electrical Engineering,Mumbai,Maharashtra,India,400076"}]},{"given":"Souvik","family":"Mahapatra","sequence":"additional","affiliation":[{"name":"Indian Institute of Technology Bombay,Department of Electrical Engineering,Mumbai,Maharashtra,India,400076"}]},{"given":"Shyam","family":"Raghunathan","sequence":"additional","affiliation":[{"name":"Micron Technology, Singapore ; Hyderabad, India,San Jose,USA"}]},{"given":"Yingda","family":"Dong","sequence":"additional","affiliation":[{"name":"Micron Technology, Singapore ; Hyderabad, India,San Jose,USA"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2020.2968079"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IMW56887.2023.10145969"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2020.3028349"},{"key":"ref4","first-page":"81","volume-title":"Recent Advances in PMOS Negative Bias Temperature Instability","author":"Mahapatra","year":"2021"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS48203.2023.10118096"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS48228.2024.10529433"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2004.836721"}],"event":{"name":"2024 IEEE International Memory Workshop (IMW)","start":{"date-parts":[[2024,5,12]]},"location":"Seoul, Korea, Republic of","end":{"date-parts":[[2024,5,15]]}},"container-title":["2024 IEEE International Memory Workshop (IMW)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10536936\/10536916\/10536955.pdf?arnumber=10536955","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,25]],"date-time":"2024-05-25T04:50:18Z","timestamp":1716612618000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10536955\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,5,12]]},"references-count":7,"URL":"https:\/\/doi.org\/10.1109\/imw59701.2024.10536955","relation":{},"subject":[],"published":{"date-parts":[[2024,5,12]]}}}