{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,3]],"date-time":"2026-03-03T16:09:58Z","timestamp":1772554198609,"version":"3.50.1"},"reference-count":12,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,5,12]],"date-time":"2024-05-12T00:00:00Z","timestamp":1715472000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,5,12]],"date-time":"2024-05-12T00:00:00Z","timestamp":1715472000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,5,12]]},"DOI":"10.1109\/imw59701.2024.10536957","type":"proceedings-article","created":{"date-parts":[[2024,5,24]],"date-time":"2024-05-24T17:19:11Z","timestamp":1716571151000},"page":"1-4","source":"Crossref","is-referenced-by-count":10,"title":["Charge trapping challenges of CMOS embedded complementary FeFETs"],"prefix":"10.1109","author":[{"given":"Sven","family":"Beyer","sequence":"first","affiliation":[{"name":"GlobalFoundries Module One LLC &Co. KG,Dresden,Germany"}]},{"given":"Dominik","family":"Kleimaier","sequence":"additional","affiliation":[{"name":"GlobalFoundries Module One LLC &Co. KG,Dresden,Germany"}]},{"given":"Stefan","family":"D\u00fcnkel","sequence":"additional","affiliation":[{"name":"GlobalFoundries Module One LLC &Co. KG,Dresden,Germany"}]},{"given":"Halid","family":"Mulaosmanovic","sequence":"additional","affiliation":[{"name":"GlobalFoundries Module One LLC &Co. KG,Dresden,Germany"}]},{"given":"Steven","family":"Soss","sequence":"additional","affiliation":[{"name":"GlobalFoundries Module One LLC &Co. KG,Dresden,Germany"}]},{"given":"Johannes","family":"M\u00fcller","sequence":"additional","affiliation":[{"name":"GlobalFoundries Module One LLC &Co. KG,Dresden,Germany"}]},{"given":"Zhouhang","family":"Jiang","sequence":"additional","affiliation":[{"name":"University of Notre Dame,Notre Dame,Indiana,USA"}]},{"given":"Kai","family":"Ni","sequence":"additional","affiliation":[{"name":"University of Notre Dame,Notre Dame,Indiana,USA"}]},{"given":"Thomas","family":"Mikolajick","sequence":"additional","affiliation":[{"name":"NaMLab gGmbH,Dresden,Germany"}]},{"given":"Haidi","family":"Zhou","sequence":"additional","affiliation":[{"name":"Ferroelectric Memory GmbH,Dresden,Germany"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-023-42110-y"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2023.3313112"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IMW48823.2020.9108150"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1039\/D1QI00167A"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2014.6860603"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-TSA51926.2021.9440081"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2021.3118645"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2020.3004033"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1021\/acsami.6b13866"},{"key":"ref10","article-title":"Mechanism of retention degradation after endurance cycling of HfO2-based ferroelectric transistors","volume-title":"2021 Symposium on VLSI Technology","author":"Zhou"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1021\/acs.nanolett.2c04706"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2009.2016954"}],"event":{"name":"2024 IEEE International Memory Workshop (IMW)","location":"Seoul, Korea, Republic of","start":{"date-parts":[[2024,5,12]]},"end":{"date-parts":[[2024,5,15]]}},"container-title":["2024 IEEE International Memory Workshop (IMW)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10536936\/10536916\/10536957.pdf?arnumber=10536957","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,25]],"date-time":"2024-05-25T04:50:19Z","timestamp":1716612619000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10536957\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,5,12]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/imw59701.2024.10536957","relation":{},"subject":[],"published":{"date-parts":[[2024,5,12]]}}}