{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T05:50:35Z","timestamp":1730267435340,"version":"3.28.0"},"reference-count":9,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,5,12]],"date-time":"2024-05-12T00:00:00Z","timestamp":1715472000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,5,12]],"date-time":"2024-05-12T00:00:00Z","timestamp":1715472000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,5,12]]},"DOI":"10.1109\/imw59701.2024.10536964","type":"proceedings-article","created":{"date-parts":[[2024,5,24]],"date-time":"2024-05-24T17:19:11Z","timestamp":1716571151000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["A Novel Program-verify Free and Low Drift Multilevel Operation on Cross-point OTS-PCM for In-Memory Computing Application"],"prefix":"10.1109","author":[{"given":"W. C.","family":"Chien","sequence":"first","affiliation":[{"name":"Emerging Central Lab,Macronix International Co., Ltd."}]},{"given":"C. L.","family":"Sung","sequence":"additional","affiliation":[{"name":"Emerging Central Lab,Macronix International Co., Ltd."}]},{"given":"R. L.","family":"Bruce","sequence":"additional","affiliation":[{"name":"IBM T.J. Watson Research Center,Macronix International Co., Ltd.,Yorktown Heights,NY,USA,10598"}]},{"given":"C. W.","family":"Yeh","sequence":"additional","affiliation":[{"name":"Emerging Central Lab,Macronix International Co., Ltd."}]},{"given":"H. Y.","family":"Cheng","sequence":"additional","affiliation":[{"name":"Emerging Central Lab,Macronix International Co., Ltd."}]},{"given":"Z. L.","family":"Liu","sequence":"additional","affiliation":[{"name":"Emerging Central Lab,Macronix International Co., Ltd."}]},{"given":"E. K.","family":"Lai","sequence":"additional","affiliation":[{"name":"Emerging Central Lab,Macronix International Co., Ltd."}]},{"given":"C. W.","family":"Cheng","sequence":"additional","affiliation":[{"name":"IBM T.J. Watson Research Center,Macronix International Co., Ltd.,Yorktown Heights,NY,USA,10598"}]},{"given":"J. X.","family":"Zheng","sequence":"additional","affiliation":[{"name":"Emerging Central Lab,Macronix International Co., Ltd."}]},{"given":"A.","family":"Grun","sequence":"additional","affiliation":[{"name":"Emerging Central Lab,Macronix International Co., Ltd."}]},{"given":"A.","family":"Ray","sequence":"additional","affiliation":[{"name":"IBM T.J. Watson Research Center,Macronix International Co., Ltd.,Yorktown Heights,NY,USA,10598"}]},{"given":"D.","family":"Daudelin","sequence":"additional","affiliation":[{"name":"IBM T.J. Watson Research Center,Macronix International Co., Ltd.,Yorktown Heights,NY,USA,10598"}]},{"given":"H. Y.","family":"Ho","sequence":"additional","affiliation":[{"name":"Product Design and Engineering Center,Macronix International Co., Ltd.,Hsinchu,Taiwan"}]},{"given":"M.","family":"BrightSky","sequence":"additional","affiliation":[{"name":"IBM T.J. Watson Research Center,Macronix International Co., Ltd.,Yorktown Heights,NY,USA,10598"}]},{"given":"H. L.","family":"Lung","sequence":"additional","affiliation":[{"name":"Emerging Central Lab,Macronix International Co., Ltd."}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"crossref","first-page":"173","DOI":"10.1038\/s41578-019-0159-3","volume":"5","author":"Wang","year":"2020","journal-title":"Nat. Rev. Mater."},{"key":"ref2","doi-asserted-by":"crossref","first-page":"333","DOI":"10.1038\/s41928-018-0092-2","volume":"1","author":"Ielmini","year":"2018","journal-title":"Nat. Electron."},{"key":"ref3","first-page":"10","author":"Horowitz","year":"2014","journal-title":"ISSCC"},{"key":"ref4","doi-asserted-by":"crossref","first-page":"7","DOI":"10.1109\/MM.2011.89","volume":"31","author":"Keckler","year":"2011","journal-title":"IEEE Micro"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"246","DOI":"10.1038\/s41928-018-0054-8","volume":"1","author":"Gallo","year":"2018","journal-title":"Nat. Electron."},{"key":"ref6","doi-asserted-by":"crossref","first-page":"60","DOI":"10.1038\/s41586-018-0180-5","volume":"558","author":"Ambrogio","year":"2018","journal-title":"Nature"},{"key":"ref7","doi-asserted-by":"crossref","first-page":"2514","DOI":"10.1038\/s41467-018-04933-y","volume":"9","author":"Boybat","year":"2018","journal-title":"Nat. Comm."},{"key":"ref8","first-page":"497","author":"Fazio","year":"2020","journal-title":"IEDM"},{"issue":"5","key":"ref9","volume":"1","author":"Gong","year":"2020","journal-title":"VLSIT, TM"}],"event":{"name":"2024 IEEE International Memory Workshop (IMW)","start":{"date-parts":[[2024,5,12]]},"location":"Seoul, Korea, Republic of","end":{"date-parts":[[2024,5,15]]}},"container-title":["2024 IEEE International Memory Workshop (IMW)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10536936\/10536916\/10536964.pdf?arnumber=10536964","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,27]],"date-time":"2024-05-27T17:19:52Z","timestamp":1716830392000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10536964\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,5,12]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/imw59701.2024.10536964","relation":{},"subject":[],"published":{"date-parts":[[2024,5,12]]}}}