{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T18:48:38Z","timestamp":1729622918195,"version":"3.28.0"},"reference-count":20,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,7]]},"DOI":"10.1109\/indin.2016.7819227","type":"proceedings-article","created":{"date-parts":[[2017,1,19]],"date-time":"2017-01-19T21:21:44Z","timestamp":1484860904000},"page":"570-575","source":"Crossref","is-referenced-by-count":1,"title":["Optical methods for the analysis of residual stresses and measurement of displacements in the nanometric range"],"prefix":"10.1109","author":[{"given":"G.","family":"Pedrini","sequence":"first","affiliation":[]},{"given":"V.","family":"Martinez-Garcia","sequence":"additional","affiliation":[]},{"given":"P.","family":"Weidmann","sequence":"additional","affiliation":[]},{"given":"A.","family":"Singh","sequence":"additional","affiliation":[]},{"given":"W.","family":"Osten","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/S0143-8166(01)00041-0"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1364\/AO.38.007056"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1364\/AO.45.003456"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/s11340-015-0120-3"},{"journal-title":"Image correlation for Shape Motion and Deformation Measurements Basic Concepts Theory and Applications","year":"2009","author":"sutton","key":"ref14"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1364\/AO.32.002278"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1364\/AO.36.002875"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.4028\/www.scientific.net\/AMM.7-8.265"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511622465"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.optcom.2004.11.101"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s11340-014-9935-6"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/s11340-010-9408-5"},{"key":"ref6","article-title":"Residual Stress Measurement using the hole drilling method and laser speckle interferometry, Parts I-IV","volume":"27","author":"steinzig","year":"2003","journal-title":"Experimental Techniques"},{"article-title":"Hole drilling and ring coring” Chapter 2 in” Practical residual stress measurement methods","year":"0","author":"schajer","key":"ref5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/BF02427906"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1115\/1.1839211"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1115\/1.2204952"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.surfcoat.2006.04.040"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1364\/AO.48.002275"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1364\/OPEX.14.000120"}],"event":{"name":"2016 IEEE 14th International Conference on Industrial Informatics (INDIN)","start":{"date-parts":[[2016,7,19]]},"location":"Poitiers, France","end":{"date-parts":[[2016,7,21]]}},"container-title":["2016 IEEE 14th International Conference on Industrial Informatics (INDIN)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7800953\/7819121\/07819227.pdf?arnumber=7819227","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,12,13]],"date-time":"2017-12-13T14:50:07Z","timestamp":1513176607000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7819227\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,7]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/indin.2016.7819227","relation":{},"subject":[],"published":{"date-parts":[[2016,7]]}}}