{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,2]],"date-time":"2025-09-02T00:03:54Z","timestamp":1756771434943,"version":"3.44.0"},"reference-count":28,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,7,1]],"date-time":"2019-07-01T00:00:00Z","timestamp":1561939200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,7,1]],"date-time":"2019-07-01T00:00:00Z","timestamp":1561939200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,7]]},"DOI":"10.1109\/indin41052.2019.8972032","type":"proceedings-article","created":{"date-parts":[[2020,1,31]],"date-time":"2020-01-31T00:16:43Z","timestamp":1580429803000},"page":"1021-1026","source":"Crossref","is-referenced-by-count":5,"title":["Proximity Contours: Vision based Detection and Tracking of Objects in Manufacturing Plants using Industrial Control Systems"],"prefix":"10.1109","author":[{"given":"S","family":"Shishira","sequence":"first","affiliation":[{"name":"ABB Corporate Research Center,Bengaluru,India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vidyadhar","family":"Rao","sequence":"additional","affiliation":[{"name":"ABB Corporate Research Center,Bengaluru,India"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sithu D","family":"Sudarsan","sequence":"additional","affiliation":[{"name":"ABB Corporate Research Center,Bengaluru,India"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1088\/1757-899X\/384\/1\/012050"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.jestch.2016.04.007"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2006.06.068"},{"key":"ref13","volume":"63","author":"juds","year":"1988","journal-title":"Photoelectric Sensors and Controls Selection and Applications"},{"journal-title":"Vulnerability Assessment of Physical Protection Systems","year":"2005","author":"garcia","key":"ref14"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/INDIN.2017.8104800"},{"key":"ref16","article-title":"Tracking and grasping of known and unknown objects from a conveyor belt","author":"navarro","year":"2014","journal-title":"41st International Symposium on Robotics VDE"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2014.7048866"},{"journal-title":"Machine Vision Theory Algorithms Practicalities","year":"2004","author":"davies","key":"ref18"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/1015706.1015720"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/CCPR.2009.5344078"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/FOSE.2007.19"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/CSSE.2008.206"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2003.1160055"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2006.874493"},{"key":"ref5","article-title":"Internet of things in industries: A survey","author":"da xu","year":"2014","journal-title":"IEEE Transactions on Industrial Informatics"},{"article-title":"Solid state magnetic sensors","year":"1994","author":"roumenin","key":"ref8"},{"journal-title":"Sensors for industrial inspection","year":"2012","author":"loughlin","key":"ref7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/C-M.1977.217596"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICSENS.2016.7808496"},{"journal-title":"Sensors and control systems in manufacturing","year":"2010","author":"soloman","key":"ref1"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.imavis.2012.06.010"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.1979.4310076"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/S0146-664X(72)80017-0"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/B978-0-08-051581-6.50024-6"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1080\/2151237X.2007.10129236"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ICSMC.2004.1400815"},{"key":"ref25","article-title":"Comparative study of background subtraction algorithms","author":"benezeth","year":"2010","journal-title":"Journal of Electronic Imaging"}],"event":{"name":"2019 IEEE 17th International Conference on Industrial Informatics (INDIN)","start":{"date-parts":[[2019,7,22]]},"location":"Helsinki, Finland","end":{"date-parts":[[2019,7,25]]}},"container-title":["2019 IEEE 17th International Conference on Industrial Informatics (INDIN)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8961950\/8972012\/08972032.pdf?arnumber=8972032","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T19:22:49Z","timestamp":1756754569000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8972032\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,7]]},"references-count":28,"URL":"https:\/\/doi.org\/10.1109\/indin41052.2019.8972032","relation":{},"subject":[],"published":{"date-parts":[[2019,7]]}}}