{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,2]],"date-time":"2025-09-02T00:03:56Z","timestamp":1756771436879,"version":"3.44.0"},"reference-count":16,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,7,1]],"date-time":"2019-07-01T00:00:00Z","timestamp":1561939200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,7,1]],"date-time":"2019-07-01T00:00:00Z","timestamp":1561939200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,7]]},"DOI":"10.1109\/indin41052.2019.8972212","type":"proceedings-article","created":{"date-parts":[[2020,1,31]],"date-time":"2020-01-31T00:16:43Z","timestamp":1580429803000},"page":"1271-1274","source":"Crossref","is-referenced-by-count":1,"title":["Adaptive Remaining Useful Lifetime Prediction of Magnetic Head under Varying Stress Conditions"],"prefix":"10.1109","author":[{"given":"Yizhen","family":"Peng","sequence":"first","affiliation":[{"name":"Chongqing University,College of Mechanical Engineering,Chongqing,China"}]},{"given":"Yu","family":"Wang","sequence":"additional","affiliation":[{"name":"Xi&#x2019;an Jiaotong University,State Key Laboratory for Manufacturing and Systems Engineering,Xi&#x2019;an,China"}]},{"given":"Tommy W. S.","family":"Chow","sequence":"additional","affiliation":[{"name":"City University of Hong Kong,Electronic Engineering Department,Hong Kong,China"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1023\/A:1008935410038"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/TIE.2015.2455055"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1109\/TMAG.2013.2293636"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1109\/TMAG.2003.808915"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1016\/j.ress.2010.08.009"},{"key":"ref15","article-title":"The EM algorithm and extensions","author":"mclachlan","year":"2007","journal-title":"John Wiley & Sons"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1016\/j.automatica.2010.10.013"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.2514\/3.3166"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1155\/2015\/793161"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1016\/j.ymssp.2012.08.016"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1016\/j.microrel.2010.09.013"},{"key":"ref8","first-page":"1084","article-title":"Life Prediction Approach by Integrating Nonlinear Accelerated Degradation Model and Hazard Rate Model","volume":"45","author":"zhou","year":"2017","journal-title":"Acta Electronica Sinica"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/TR.2017.2742298"},{"key":"ref2","doi-asserted-by":"crossref","first-page":"222","DOI":"10.1109\/TCAPT.2006.870387","article-title":"Prognostics and health management of electronics","volume":"29","author":"nikhil","year":"2006","journal-title":"IEEE Trans Compon Packag Technol"},{"year":"2008","author":"pecht","article-title":"Prognostics and Health Management of Electronics","key":"ref1"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/TIE.2014.2336616"}],"event":{"name":"2019 IEEE 17th International Conference on Industrial Informatics (INDIN)","start":{"date-parts":[[2019,7,22]]},"location":"Helsinki, Finland","end":{"date-parts":[[2019,7,25]]}},"container-title":["2019 IEEE 17th International Conference on Industrial Informatics (INDIN)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8961950\/8972012\/08972212.pdf?arnumber=8972212","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T19:22:46Z","timestamp":1756754566000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8972212\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,7]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/indin41052.2019.8972212","relation":{},"subject":[],"published":{"date-parts":[[2019,7]]}}}