{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:11:21Z","timestamp":1740100281648,"version":"3.37.3"},"reference-count":30,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,7,21]],"date-time":"2021-07-21T00:00:00Z","timestamp":1626825600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,7,21]],"date-time":"2021-07-21T00:00:00Z","timestamp":1626825600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100020487","name":"Nature","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100020487","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004517","name":"Tianjin University","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004517","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,7,21]]},"DOI":"10.1109\/indin45523.2021.9557388","type":"proceedings-article","created":{"date-parts":[[2021,10,11]],"date-time":"2021-10-11T21:23:04Z","timestamp":1633987384000},"page":"1-5","source":"Crossref","is-referenced-by-count":4,"title":["An Ensemble Approach for Fault Diagnosis via Continuous Learning"],"prefix":"10.1109","author":[{"given":"Dapeng","family":"Zhang","sequence":"first","affiliation":[{"name":"Tianjin University,School of Electrical and Information Engineering,Tianjin,China"}]},{"given":"Zhiwei","family":"Gao","sequence":"additional","affiliation":[{"name":"University of Northumbria,Faculty of Engineering and Environment,Newcastle Upon Tyne,UK"}]}],"member":"263","reference":[{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2893845"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2014.2330494"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s00521-019-04438-9"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.jobe.2020.101388"},{"key":"ref13","doi-asserted-by":"crossref","first-page":"436","DOI":"10.1038\/nature14539","article-title":"Deep learning","volume":"521","author":"lecun","year":"2015","journal-title":"Nature"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1038\/nature14236"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2017.11.007"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.3390\/s21041249"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2814818"},{"key":"ref18","doi-asserted-by":"crossref","first-page":"8760","DOI":"10.1109\/TIE.2018.2833045","article-title":"Real-Time fault detection and identification for MMC using 1-D convolutional neural networks","volume":"66","author":"serkan","year":"2019","journal-title":"IEEE Transactions on Industrial Electronics"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2844805"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2013.2259235"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.renene.2020.01.010"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.3182\/20090630-4-ES-2003.00026"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCA.2008.923050"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.3390\/pr9020300"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.renene.2017.10.059"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2013.2281002"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.enbuild.2018.10.013"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2863191"},{"key":"ref2","first-page":"3768","article-title":"A survey of fault diagnosis and fault-tolerant techniques—Part II: fault diagnosis with knowledge-based and hybrid\/active approaches","volume":"62","author":"gao","year":"2015","journal-title":"IEEE Trans Indusrial Electronics"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.compchemeng.2018.03.022"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2417501"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2942548"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2019.07.001"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.compchemeng.2018.04.009"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2774777"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2902003"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2877090"},{"key":"ref25","first-page":"3320","article-title":"How transferable are features in deep neural networks?","author":"yosinski","year":"2014","journal-title":"Advances in neural information processing systems"}],"event":{"name":"2021 IEEE 19th International Conference on Industrial Informatics (INDIN)","start":{"date-parts":[[2021,7,21]]},"location":"Palma de Mallorca, Spain","end":{"date-parts":[[2021,7,23]]}},"container-title":["2021 IEEE 19th International Conference on Industrial Informatics (INDIN)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9557349\/9557353\/09557388.pdf?arnumber=9557388","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,8,2]],"date-time":"2022-08-02T23:36:25Z","timestamp":1659483385000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9557388\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,7,21]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/indin45523.2021.9557388","relation":{},"subject":[],"published":{"date-parts":[[2021,7,21]]}}}