{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T06:01:56Z","timestamp":1730268116339,"version":"3.28.0"},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,7,21]],"date-time":"2021-07-21T00:00:00Z","timestamp":1626825600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,7,21]],"date-time":"2021-07-21T00:00:00Z","timestamp":1626825600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,7,21]],"date-time":"2021-07-21T00:00:00Z","timestamp":1626825600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,7,21]]},"DOI":"10.1109\/indin45523.2021.9557411","type":"proceedings-article","created":{"date-parts":[[2021,10,11]],"date-time":"2021-10-11T17:23:04Z","timestamp":1633972984000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Adaptive Canonical Correlation Analysis Method Based on Forgetting Factor for Fault Detection"],"prefix":"10.1109","author":[{"given":"Jian","family":"Guan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jinghui","family":"Yang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Guang","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.conengprac.2015.10.006"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"1559","DOI":"10.1109\/TIE.2017.2733501","article-title":"Fault detection for non-gaussian processes using generalized canonical correlation analysis and randomized algorithms","volume":"65","author":"chen","year":"2017","journal-title":"IEEE Transactions on Industrial Electronics"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2017.06.017"},{"key":"ref13","doi-asserted-by":"crossref","first-page":"104692","DOI":"10.1016\/j.conengprac.2020.104692","article-title":"Key-performance-indicator-related state monitoring based on kernel canonical correlation analysis","volume":"107","author":"chen","year":"2021","journal-title":"Control Engineering Practice"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2014.12.017"},{"key":"ref15","doi-asserted-by":"crossref","first-page":"20798","DOI":"10.1021\/acs.iecr.0c04572","article-title":"Simultaneous fault detection and diagnosis using adaptive principal component analysis and multivariate contribution analysis","volume":"59","author":"elshenawy","year":"2020","journal-title":"Industrial & Engineering Chemistry Research"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2015.06.008"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2019.107227"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2019.2897477"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2989708"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.compchemeng.2019.04.003"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2017.10.010"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"16676","DOI":"10.1021\/acs.iecr.9b00701","article-title":"Dynamic nonlinear partial least squares modeling using gaussian process regression","volume":"58","author":"liu","year":"2019","journal-title":"Industrial & Engineering Chemistry Research"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2939876"},{"key":"ref8","doi-asserted-by":"crossref","first-page":"6321","DOI":"10.1109\/TIE.2018.2873100","article-title":"A cumulative canonical correlation analysis-based sensor precision degradation detection method","volume":"66","author":"chen","year":"2018","journal-title":"IEEE Transactions on Industrial Electronics"},{"key":"ref7","doi-asserted-by":"crossref","first-page":"114166","DOI":"10.1016\/j.eswa.2020.114166","article-title":"An extensible quality-related fault isolation framework based on dual broad partial least squares with application to the hot rolling process","volume":"167","author":"zhang","year":"2021","journal-title":"Expert Systems with Applications"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2018.02.051"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1098\/rsta.2015.0202"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2893125"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.conengprac.2012.10.002"}],"event":{"name":"2021 IEEE 19th International Conference on Industrial Informatics (INDIN)","start":{"date-parts":[[2021,7,21]]},"location":"Palma de Mallorca, Spain","end":{"date-parts":[[2021,7,23]]}},"container-title":["2021 IEEE 19th International Conference on Industrial Informatics (INDIN)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9557349\/9557353\/09557411.pdf?arnumber=9557411","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T11:46:51Z","timestamp":1652183211000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9557411\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,7,21]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/indin45523.2021.9557411","relation":{},"subject":[],"published":{"date-parts":[[2021,7,21]]}}}