{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T06:02:40Z","timestamp":1730268160892,"version":"3.28.0"},"reference-count":16,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,7,20]],"date-time":"2020-07-20T00:00:00Z","timestamp":1595203200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,7,20]],"date-time":"2020-07-20T00:00:00Z","timestamp":1595203200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,7,20]],"date-time":"2020-07-20T00:00:00Z","timestamp":1595203200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,7,20]]},"DOI":"10.1109\/indin45582.2020.9442093","type":"proceedings-article","created":{"date-parts":[[2021,6,8]],"date-time":"2021-06-08T17:43:32Z","timestamp":1623174212000},"page":"461-468","source":"Crossref","is-referenced-by-count":2,"title":["Application of Improved DBSCAN Clustering Algorithm on Industrial Fault Text Data"],"prefix":"10.1109","author":[{"given":"Xiaohan","family":"Wang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lin","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xuesong","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kunyu","family":"Xie","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICSSSM.2007.4280175"},{"key":"ref11","first-page":"530","article-title":"SA-DBSCAN: adaptive density-based clustering algorithm","volume":"26","author":"xia","year":"2009","journal-title":"Journal of the Graduate School of the Chinese Academy of Sciences"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCBB.2017.2690282"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2015.11.028"},{"key":"ref14","first-page":"3781","article-title":"Uncertain data cluster based on DBSCAN","author":"pan","year":"2011","journal-title":"2011 International Conference on Multimedia Technology 2011 July 26–28"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/1553374.1553511"},{"key":"ref16","first-page":"410","article-title":"V-Measure: a conditional entropy-based external cluster evaluation measure","author":"rosenberg","year":"0","journal-title":"Proceedings of the 2007 Joint Conference on Empirical Methods in Natural Language Processing and Computational Natural Language Learning"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2019.2901370"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2018.2796860"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TNN.2007.895820"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCB.2008.2004559"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2016.2616302"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2019.12.019"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TKDE.2015.2492559"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/91.842156"},{"key":"ref9","first-page":"780","article-title":"GMDBSCAN: multi-density DBSCAN cluster based on grid","author":"chen","year":"2008","journal-title":"2008 IEEE International Conference on e-Business Engineering 2008 Oct 22–24"}],"event":{"name":"2020 IEEE 18th International Conference on Industrial Informatics (INDIN)","start":{"date-parts":[[2020,7,20]]},"location":"Warwick, United Kingdom","end":{"date-parts":[[2020,7,23]]}},"container-title":["2020 IEEE 18th International Conference on Industrial Informatics (INDIN)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9441666\/9442071\/09442093.pdf?arnumber=9442093","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,28]],"date-time":"2022-06-28T17:57:25Z","timestamp":1656439045000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9442093\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,7,20]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/indin45582.2020.9442093","relation":{},"subject":[],"published":{"date-parts":[[2020,7,20]]}}}