{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,12]],"date-time":"2026-06-12T04:34:13Z","timestamp":1781238853027,"version":"3.54.1"},"reference-count":29,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,7,18]],"date-time":"2023-07-18T00:00:00Z","timestamp":1689638400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,7,18]],"date-time":"2023-07-18T00:00:00Z","timestamp":1689638400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,7,18]]},"DOI":"10.1109\/indin51400.2023.10218129","type":"proceedings-article","created":{"date-parts":[[2023,8,22]],"date-time":"2023-08-22T17:36:36Z","timestamp":1692725796000},"page":"1-8","source":"Crossref","is-referenced-by-count":11,"title":["Measuring the Robustness of ML Models Against Data Quality Issues in Industrial Time Series Data"],"prefix":"10.1109","author":[{"given":"Marcel","family":"Dix","sequence":"first","affiliation":[{"name":"Industrial AI ABB Corporate Research Center,Ladenburg,Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Gianluca","family":"Manca","sequence":"additional","affiliation":[{"name":"Industrial AI ABB Corporate Research Center,Ladenburg,Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Kenneth Chigozie","family":"Okafor","sequence":"additional","affiliation":[{"name":"Otto-von-Guericke University,Department of Computer Science,Magdeburg,Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Reuben","family":"Borrison","sequence":"additional","affiliation":[{"name":"Industrial AI ABB Corporate Research Center,Ladenburg,Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Konstantin","family":"Kirchheim","sequence":"additional","affiliation":[{"name":"Otto-von-Guericke University,Department of Computer Science,Magdeburg,Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Divyasheel","family":"Sharma","sequence":"additional","affiliation":[{"name":"Industrial Software Research ABB Corporate Research Center,Bangalore,India"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Kr","family":"Chandrika","sequence":"additional","affiliation":[{"name":"Industrial Software Research ABB Corporate Research Center,Bangalore,India"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Deepti","family":"Maduskar","sequence":"additional","affiliation":[{"name":"Industrial Software Research ABB Corporate Research Center,Bangalore,India"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Frank","family":"Ortmeier","sequence":"additional","affiliation":[{"name":"Otto-von-Guericke University,Department of Computer Science,Magdeburg,Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref13","first-page":"1","article-title":"Requirements for data quality metrics","volume":"9","author":"heinrich","year":"2018","journal-title":"Journal of Data and Information Quality (JDIQ)"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.3389\/fdata.2022.850611"},{"key":"ref15","author":"schelter","year":"2021","journal-title":"Jenga a framework to study the impact of data errors on the predictions of machine learning models"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-24106-7"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/1541880.1541883"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/InfRKM.2012.6204995"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3128695"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-84337-3_2"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.25080\/Majora-92bf1922-00a"},{"key":"ref16","first-page":"blatt 1:2015","year":"2015","journal-title":"Formalised process descriptions Concept and graphic representation"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/0098-1354(93)80018-I"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/MCSE.2007.55"},{"key":"ref24","author":"sch\u00e4fer","year":"2017","journal-title":"Multivariate time series classification with weasel+ muse"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ICPS51978.2022.9816853"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/s10994-021-06057-9"},{"key":"ref25","article-title":"catch22: Canonical time-series characteristics. arxiv 2019","author":"lubba","year":"0","journal-title":"arXiv preprint arXiv 1901 10055"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.ifacol.2015.08.199"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/0959-1524(96)00031-5"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.compchemeng.2022.107964"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/s10618-022-00844-1"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-662-55608-5_2"},{"key":"ref29","article-title":"sktime: A unified interface for machine learning with time series","volume":"abs 1909 7872","author":"l\u00f6ning","year":"2019","journal-title":"CoRR"},{"key":"ref8","first-page":"41","article-title":"Data quality in time series data: An experience report","author":"gitzel","year":"2016","journal-title":"CBI (Industrial Track)"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/BigDataCongress.2018.00029"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.3390\/s17092010"},{"key":"ref4","article-title":"Xai for operations in the process industry-applications, theses, and research directions","author":"kotriwala","year":"2021","journal-title":"AAAI Spring Symposium Combining Machine Learning with Knowledge Engineering"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/INDIN.2016.7819366"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.3390\/s21175834"},{"key":"ref5","article-title":"The effects of data quality on machine learning performance","author":"budach","year":"2022","journal-title":"arXiv preprint arXiv 2207 14529"}],"event":{"name":"2023 IEEE 21st International Conference on Industrial Informatics (INDIN)","location":"Lemgo, Germany","start":{"date-parts":[[2023,7,18]]},"end":{"date-parts":[[2023,7,20]]}},"container-title":["2023 IEEE 21st International Conference on Industrial Informatics (INDIN)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10217218\/10217836\/10218129.pdf?arnumber=10218129","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,9,11]],"date-time":"2023-09-11T17:55:10Z","timestamp":1694454910000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10218129\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,7,18]]},"references-count":29,"URL":"https:\/\/doi.org\/10.1109\/indin51400.2023.10218129","relation":{},"subject":[],"published":{"date-parts":[[2023,7,18]]}}}