{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,2]],"date-time":"2025-11-02T14:19:11Z","timestamp":1762093151125,"version":"build-2065373602"},"reference-count":9,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,7,18]],"date-time":"2023-07-18T00:00:00Z","timestamp":1689638400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,7,18]],"date-time":"2023-07-18T00:00:00Z","timestamp":1689638400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,7,18]]},"DOI":"10.1109\/indin51400.2023.10218143","type":"proceedings-article","created":{"date-parts":[[2023,8,22]],"date-time":"2023-08-22T17:36:36Z","timestamp":1692725796000},"page":"1-7","source":"Crossref","is-referenced-by-count":3,"title":["Automated Physical TestBeds (APTB 2.0): Enabling Reliable and Efficient Testing of Wireless Communication Networks for IoT and Industry 4.0"],"prefix":"10.1109","author":[{"given":"Axel","family":"Sikora","sequence":"first","affiliation":[{"name":"Institute of Reliable Embedded Systems and Communication Electronics (ivESK) Offenburg University of Applied Sciences,Offenburg,Germany,77652"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fabian","family":"Sowieja","sequence":"additional","affiliation":[{"name":"Institute of Reliable Embedded Systems and Communication Electronics (ivESK) Offenburg University of Applied Sciences,Offenburg,Germany,77652"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sebastian E","family":"Jubin","sequence":"additional","affiliation":[{"name":"Institute of Reliable Embedded Systems and Communication Electronics (ivESK) Offenburg University of Applied Sciences,Offenburg,Germany,77652"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Manuel","family":"Schappacher","sequence":"additional","affiliation":[{"name":"Institute of Reliable Embedded Systems and Communication Electronics (ivESK) Offenburg University of Applied Sciences,Offenburg,Germany,77652"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wacime","family":"Hadrich","sequence":"additional","affiliation":[{"name":"Institute of Reliable Embedded Systems and Communication Electronics (ivESK) Offenburg University of Applied Sciences,Offenburg,Germany,77652"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2015.7151579"},{"key":"ref7","first-page":"1521","article-title":"Test and measurement of lpwan and cellular iot networks in a unified testbed","volume":"1","author":"sikora","year":"2019","journal-title":"In 2019 IEEE 17th International Conference on Industrial Informatics (INDIN)"},{"key":"ref9","article-title":"Unified Multi Abstraction Level Functional Testing and Performance Measurements of NB-WWAN -Methodology, Prototype Implementation, and Evaluation","author":"sebastian","year":"0","journal-title":"MDPI Journal of Algorithms 2023 Issue (Submitted & not published yet)"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2887246"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/COMST.2014.2320051"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICICICT46008.2019.8993127"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MAP.2003.1232163"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2017.7969667"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1051\/matecconf\/20167506006"}],"event":{"name":"2023 IEEE 21st International Conference on Industrial Informatics (INDIN)","start":{"date-parts":[[2023,7,18]]},"location":"Lemgo, Germany","end":{"date-parts":[[2023,7,20]]}},"container-title":["2023 IEEE 21st International Conference on Industrial Informatics (INDIN)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10217218\/10217836\/10218143.pdf?arnumber=10218143","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,9,11]],"date-time":"2023-09-11T17:54:25Z","timestamp":1694454865000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10218143\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,7,18]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/indin51400.2023.10218143","relation":{},"subject":[],"published":{"date-parts":[[2023,7,18]]}}}