{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,8]],"date-time":"2026-01-08T16:28:18Z","timestamp":1767889698836,"version":"3.49.0"},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,7,25]],"date-time":"2022-07-25T00:00:00Z","timestamp":1658707200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,7,25]],"date-time":"2022-07-25T00:00:00Z","timestamp":1658707200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,7,25]]},"DOI":"10.1109\/indin51773.2022.9976173","type":"proceedings-article","created":{"date-parts":[[2022,12,15]],"date-time":"2022-12-15T20:05:02Z","timestamp":1671134702000},"page":"735-741","source":"Crossref","is-referenced-by-count":5,"title":["Product Quality Control in Assembly Machine under Data Restricted Settings"],"prefix":"10.1109","author":[{"given":"Fatemeh","family":"Kakavandi","sequence":"first","affiliation":[{"name":"Aarhus University,Department of Electrical and Computer Engineering,Aarhus,Denmark"}]},{"given":"Roger","family":"De Reus","sequence":"additional","affiliation":[{"name":"Novo Nordisk A\/S,Device Manufacturing Development Department 2540,Hillerød,Denmark"}]},{"given":"Claudio","family":"Gomes","sequence":"additional","affiliation":[{"name":"Aarhus University,Department of Electrical and Computer Engineering,Aarhus,Denmark"}]},{"given":"Negar","family":"Heidari","sequence":"additional","affiliation":[{"name":"Aarhus University,Department of Electrical and Computer Engineering,Aarhus,Denmark"}]},{"given":"Alexandros","family":"Iosifidis","sequence":"additional","affiliation":[{"name":"Aarhus University,Department of Electrical and Computer Engineering,Aarhus,Denmark"}]},{"given":"Peter Gorm","family":"Larsen","sequence":"additional","affiliation":[{"name":"Aarhus University,Department of Electrical and Computer Engineering,Aarhus,Denmark"}]}],"member":"263","reference":[{"key":"ref10","article-title":"Learning with kernels","author":"smola","year":"1998","journal-title":"Ph D Dissertation"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1162\/089976601750264965"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/BF00994018"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1162\/089976600300015565"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2015.03.009"},{"key":"ref15","article-title":"Towards developing a digital twin for a manufacturing pilot line: An industrial case study","author":"kakavandi","year":"0","journal-title":"Digital Twin Driven Intelligent Systems Springer Nature Unpublished"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2886457"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.3390\/s20133738"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IJCNN55064.2022.9892000"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCC.2004.843228"},{"key":"ref8","first-page":"1","article-title":"Variational autoencoder based anomaly detection using reconstruction probability","volume":"2","author":"an","year":"2015","journal-title":"Special Lecture on IE"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2016.05.033"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.dss.2021.113540"},{"key":"ref1","article-title":"Quality considerations for continuous manufacturing guidance for industry","year":"0"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/SMC42975.2020.9283010"}],"event":{"name":"2022 IEEE 20th International Conference on Industrial Informatics (INDIN)","location":"Perth, Australia","start":{"date-parts":[[2022,7,25]]},"end":{"date-parts":[[2022,7,28]]}},"container-title":["2022 IEEE 20th International Conference on Industrial Informatics (INDIN)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9975846\/9976066\/09976173.pdf?arnumber=9976173","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,1,16]],"date-time":"2023-01-16T19:32:01Z","timestamp":1673897521000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9976173\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,7,25]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/indin51773.2022.9976173","relation":{},"subject":[],"published":{"date-parts":[[2022,7,25]]}}}