{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,7]],"date-time":"2026-01-07T06:10:08Z","timestamp":1767766208468,"version":"3.48.0"},"reference-count":34,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,7,12]],"date-time":"2025-07-12T00:00:00Z","timestamp":1752278400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,7,12]],"date-time":"2025-07-12T00:00:00Z","timestamp":1752278400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,7,12]]},"DOI":"10.1109\/indin64977.2025.11279031","type":"proceedings-article","created":{"date-parts":[[2026,1,6]],"date-time":"2026-01-06T18:33:35Z","timestamp":1767724415000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Monitoring and Management of Heterogeneous TSN Networks for Industry 4.0: A Survey"],"prefix":"10.1109","author":[{"given":"Seyedali","family":"Hadian","sequence":"first","affiliation":[{"name":"Institute of Reliable Embedded Systems and Communication Electronics (ivESK), Offenburg University,Offenburg,Germany,77652"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Manuel","family":"Schappacher","sequence":"additional","affiliation":[{"name":"Institute of Reliable Embedded Systems and Communication Electronics (ivESK), Offenburg University,Offenburg,Germany,77652"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dominik","family":"Welte","sequence":"additional","affiliation":[{"name":"Institute of Reliable Embedded Systems and Communication Electronics (ivESK), Offenburg University,Offenburg,Germany,77652"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Axel","family":"Sikora","sequence":"additional","affiliation":[{"name":"Institute of Reliable Embedded Systems and Communication Electronics (ivESK), Offenburg University,Offenburg,Germany,77652"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/IOTM.001.2300048"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/MIE.2016.2618724"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1016\/j.compind.2020.103388"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1016\/j.compeleceng.2019.106522"},{"key":"ref5","article-title":"Information and Communication Technology for Competitive Strategies","volume-title":"Proceedings of Third International Conference on ICTCS 2017","volume":"40","author":"Fong"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1145\/3530815"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/ACCESS.2023.3286370"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/RTAS61025.2024.00017"},{"year":"2019","author":"Nasrallah","journal-title":"TSN Algorithms for Large Scale Networks: A Survey and Conceptual Comparison","key":"ref9"},{"year":"2018","author":"Nasrallah","article-title":"Ultra-low latency (ULL) networks: A comprehensive survey covering the IEEE TSN standard and related ULL research","key":"ref10"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/COMST.2024.3486618"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1109\/COMST.2024.3422613"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.33168\/jsms.2022.0204"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1145\/2372233.2372235"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.3390\/electronics13071246"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1109\/ICC59986.2023.10421203"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1109\/TNSM.2024.3447789"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1109\/IMCOM56909.2023.10035542"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1109\/ICPADS56603.2022.00016"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1109\/ICIN60470.2024.10494475"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1016\/j.comcom.2024.04.021"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.1145\/3314206.3314210"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.1109\/CAC48633.2019.8996369"},{"doi-asserted-by":"publisher","key":"ref24","DOI":"10.1109\/ETFA46521.2020.9211897"},{"doi-asserted-by":"publisher","key":"ref25","DOI":"10.1109\/ETFA46521.2020.9212141"},{"doi-asserted-by":"publisher","key":"ref26","DOI":"10.1016\/j.procir.2023.06.008"},{"doi-asserted-by":"publisher","key":"ref27","DOI":"10.1109\/WFCS60972.2024.10540878"},{"doi-asserted-by":"publisher","key":"ref28","DOI":"10.1109\/ETFA52439.2022.9921636"},{"doi-asserted-by":"publisher","key":"ref29","DOI":"10.1109\/ICECET58911.2023.10389592"},{"doi-asserted-by":"publisher","key":"ref30","DOI":"10.1109\/NetSoft54395.2022.9844050"},{"doi-asserted-by":"publisher","key":"ref31","DOI":"10.1109\/TNSM.2023.3327108"},{"doi-asserted-by":"publisher","key":"ref32","DOI":"10.1109\/INDIN51400.2023.10217839"},{"volume-title":"AccessTSN\/ControlTSN","year":"2023","article-title":"Institut f\u00fcr Steuerungstechnik der Werkzeugmaschinen und Fertigungseinrichtungen (ISW)","key":"ref33"},{"doi-asserted-by":"publisher","key":"ref34","DOI":"10.1109\/WFCS60972.2024.10541017"}],"event":{"name":"2025 IEEE 23rd International Conference on Industrial Informatics (INDIN)","start":{"date-parts":[[2025,7,12]]},"location":"Kunming, China","end":{"date-parts":[[2025,7,15]]}},"container-title":["2025 IEEE 23rd International Conference on Industrial Informatics (INDIN)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11278897\/11278845\/11279031.pdf?arnumber=11279031","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,1,7]],"date-time":"2026-01-07T05:59:24Z","timestamp":1767765564000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11279031\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,7,12]]},"references-count":34,"URL":"https:\/\/doi.org\/10.1109\/indin64977.2025.11279031","relation":{},"subject":[],"published":{"date-parts":[[2025,7,12]]}}}