{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,7]],"date-time":"2026-01-07T19:35:42Z","timestamp":1767814542434,"version":"3.49.0"},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,7,12]],"date-time":"2025-07-12T00:00:00Z","timestamp":1752278400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,7,12]],"date-time":"2025-07-12T00:00:00Z","timestamp":1752278400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100016772","name":"KT","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100016772","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001858","name":"Vinnova","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001858","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,7,12]]},"DOI":"10.1109\/indin64977.2025.11279128","type":"proceedings-article","created":{"date-parts":[[2026,1,6]],"date-time":"2026-01-06T18:33:35Z","timestamp":1767724415000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["JEDeC for Functional Safety Communication in Industrial Applications"],"prefix":"10.1109","author":[{"given":"Ming","family":"Zhan","sequence":"first","affiliation":[{"name":"Taizhou University,College of Electronic and Information Engineering,Taizhou,China,318000"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhibo","family":"Pang","sequence":"additional","affiliation":[{"name":"Royal Institute of Technology (KTH),School of Electrical Engineering and Computer Scinece,Department of Intelligent Systems,Stockholm,Sweden,114 28"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Qiang","family":"Zhou","sequence":"additional","affiliation":[{"name":"Taizhou University,College of Electronic and Information Engineering,Taizhou,China,318000"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jiangwu","family":"Zhang","sequence":"additional","affiliation":[{"name":"Hangzhou Dianzi University,College of Telecommunication Engineering,Hangzhou,China,318000"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kan","family":"Yu","sequence":"additional","affiliation":[{"name":"La Trobe University,School of Engineering and Mathematical Science,Deparement of Computer Science and Information Technology,Flora Hill,VIC,Australia,3552"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/COMST.2023.3338153"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MIE.2019.2947119"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MIE.2017.2703603"},{"key":"ref4","volume-title":"IEC 61508: Functional Safety of Electrical\/Electronic\/Programmable Electronic Safety-Related Systems, Standard","year":"2016"},{"key":"ref5","year":"2016","journal-title":"Functional Safety Fieldbuses-General Rules and Profile Definitions, International Electrotechnical Commission: Geneva, Switzerland, IEC 61784-3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.3390\/s21186073"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3160631"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2023.3251031"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICC42927.2021.9500279"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MIE.2024.3416901"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2017.2703116"},{"key":"ref12","volume-title":"Profinet system description - technology and application","year":"2014"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ISIT.2018.8437648"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2019.2896110"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2022.3230782"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2022.3171798"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/LCOMM.2022.3148302"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/MIE.2018.2850661"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2919653"}],"event":{"name":"2025 IEEE 23rd International Conference on Industrial Informatics (INDIN)","location":"Kunming, China","start":{"date-parts":[[2025,7,12]]},"end":{"date-parts":[[2025,7,15]]}},"container-title":["2025 IEEE 23rd International Conference on Industrial Informatics (INDIN)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11278897\/11278845\/11279128.pdf?arnumber=11279128","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,1,7]],"date-time":"2026-01-07T18:30:46Z","timestamp":1767810646000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11279128\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,7,12]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/indin64977.2025.11279128","relation":{},"subject":[],"published":{"date-parts":[[2025,7,12]]}}}