{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T10:46:53Z","timestamp":1725533213985},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009,6]]},"DOI":"10.1109\/iolts.2009.5195977","type":"proceedings-article","created":{"date-parts":[[2009,8,11]],"date-time":"2009-08-11T15:37:37Z","timestamp":1250005057000},"page":"15-20","source":"Crossref","is-referenced-by-count":1,"title":["An I-IP based approach for the monitoring of NBTI effects in SoCs"],"prefix":"10.1109","author":[{"given":"C.","family":"Guardiani","sequence":"first","affiliation":[]},{"given":"A.","family":"Shibkov","sequence":"additional","affiliation":[]},{"given":"A.","family":"Brambilla","sequence":"additional","affiliation":[]},{"given":"G.","family":"Storti Gajani","sequence":"additional","affiliation":[]},{"given":"D.","family":"Appello","sequence":"additional","affiliation":[]},{"given":"F.","family":"Piazza","sequence":"additional","affiliation":[]},{"given":"P.","family":"Bernardi","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"13","DOI":"10.1109\/JSSC.2008.2007145"},{"year":"2006","journal-title":"IEEE 1500 SECT standard","key":"11"},{"doi-asserted-by":"publisher","key":"12","DOI":"10.1007\/s10836-007-5014-6"},{"doi-asserted-by":"publisher","key":"3","DOI":"10.1063\/1.1604480"},{"key":"2","first-page":"92","author":"kimizuka","year":"2000","journal-title":"Symp on VLSI Technology"},{"doi-asserted-by":"publisher","key":"1","DOI":"10.1149\/1.2426565"},{"year":"0","key":"10"},{"key":"7","first-page":"1047","author":"vattikonda","year":"2006","journal-title":"Modeling and minimization of PMOS NBTI effect for robust nanometer design"},{"doi-asserted-by":"publisher","key":"6","DOI":"10.1109\/TED.2007.902883"},{"year":"0","key":"5"},{"doi-asserted-by":"publisher","key":"4","DOI":"10.1109\/RELPHY.2006.251260"},{"doi-asserted-by":"publisher","key":"9","DOI":"10.1109\/TEST.1999.805650"},{"key":"8","first-page":"489","author":"reimbolda","year":"2007","journal-title":"Initial and PBTIinduced traps and charges in Hf-based oxides\/TiN stacks"}],"event":{"name":"2009 15th IEEE International On-Line Testing Symposium (IOLTS 2009)","start":{"date-parts":[[2009,6,24]]},"location":"Sesimbra-Lisbon, Portugal","end":{"date-parts":[[2009,6,26]]}},"container-title":["2009 15th IEEE International On-Line Testing Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5176124\/5195974\/05195977.pdf?arnumber=5195977","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T00:41:40Z","timestamp":1489797700000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5195977\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,6]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/iolts.2009.5195977","relation":{},"subject":[],"published":{"date-parts":[[2009,6]]}}}