{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,19]],"date-time":"2025-03-19T11:23:33Z","timestamp":1742383413354},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009,6]]},"DOI":"10.1109\/iolts.2009.5195996","type":"proceedings-article","created":{"date-parts":[[2009,8,11]],"date-time":"2009-08-11T19:37:37Z","timestamp":1250019457000},"page":"138-143","source":"Crossref","is-referenced-by-count":3,"title":["Soft error detection and correction for FFT based convolution using different block lengths"],"prefix":"10.1109","author":[{"given":"Pedro","family":"Reviriego","sequence":"first","affiliation":[]},{"given":"Juan Antonio","family":"Maestro","sequence":"additional","affiliation":[]},{"given":"Anne","family":"O'Donnell","sequence":"additional","affiliation":[]},{"given":"Chris J.","family":"Bleakley","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"year":"0","key":"13"},{"year":"0","key":"14"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/12.464396"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/12.293265"},{"journal-title":"Digital Signal Processing Principles Algorithms and Applications","year":"1996","author":"proakis","key":"3"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.855790"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2005.69"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/EDTC.1995.470370"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/78.224241"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/29.31272"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/12.4606"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/12.59860"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2006.875374"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2008.924636"}],"event":{"name":"2009 15th IEEE International On-Line Testing Symposium (IOLTS 2009)","start":{"date-parts":[[2009,6,24]]},"location":"Sesimbra-Lisbon, Portugal","end":{"date-parts":[[2009,6,26]]}},"container-title":["2009 15th IEEE International On-Line Testing Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5176124\/5195974\/05195996.pdf?arnumber=5195996","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,17]],"date-time":"2017-03-17T20:55:20Z","timestamp":1489784120000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5195996\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,6]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/iolts.2009.5195996","relation":{},"subject":[],"published":{"date-parts":[[2009,6]]}}}