{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,17]],"date-time":"2025-09-17T15:29:00Z","timestamp":1758122940185},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009,6]]},"DOI":"10.1109\/iolts.2009.5196022","type":"proceedings-article","created":{"date-parts":[[2009,8,11]],"date-time":"2009-08-11T19:37:37Z","timestamp":1250019457000},"page":"237-242","source":"Crossref","is-referenced-by-count":5,"title":["Design techniques and tradeoffs in implementing non-destructive field test using logic BIST self-test"],"prefix":"10.1109","author":[{"given":"Amit","family":"Dutta","sequence":"first","affiliation":[]},{"given":"Malav","family":"Shah","sequence":"additional","affiliation":[]},{"given":"G.","family":"Swathi","sequence":"additional","affiliation":[]},{"given":"Rubin A.","family":"Parekhji","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2007.76"},{"key":"16","article-title":"dft implementations for striking the right balance between test cost and test quality for automotive socs","author":"dutta","year":"2008","journal-title":"Intl Test Conf"},{"key":"13","doi-asserted-by":"crossref","DOI":"10.1109\/TCAD.2004.833617","article-title":"multi-phase bist: a new reseeding technique for high test data compression","author":"kalligeros","year":"2004","journal-title":"IEEE Trans on CAD"},{"key":"14","article-title":"a bist implementation framework for supporting field testability and configurability in an automotive soc","author":"dutta","year":"2007","journal-title":"Workshop on Dependable and Secure Nanocomputing"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2007.8"},{"key":"12","doi-asserted-by":"crossref","DOI":"10.1023\/A:1015039323168","article-title":"onthe-fly reseeding: a new reseeding technique for the test-per-clock bist","author":"kalligeros","year":"2002","journal-title":"Journal of Electronic Testing Theory and Applications"},{"key":"3","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4020-2801-4","author":"gizopoulos","year":"2004","journal-title":"Embedded Processor-Based Self-Test"},{"journal-title":"IEC-61508 Standard on Safety Integrity Level (SIL) for Automotive Devices","year":"0","key":"2"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1016\/0950-5849(91)90118-U"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2003.1197634"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2008.89"},{"year":"0","key":"6"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2003.1219083"},{"journal-title":"A Designer's Guide to Built-In Self-Test","year":"2002","author":"stroud","key":"4"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2002.1041775"},{"key":"8","article-title":"lfsr-coded test patterns for scan design","author":"koenemann","year":"1991","journal-title":"Euro Test Conf"}],"event":{"name":"2009 15th IEEE International On-Line Testing Symposium (IOLTS 2009)","start":{"date-parts":[[2009,6,24]]},"location":"Sesimbra-Lisbon, Portugal","end":{"date-parts":[[2009,6,26]]}},"container-title":["2009 15th IEEE International On-Line Testing Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5176124\/5195974\/05196022.pdf?arnumber=5196022","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,18]],"date-time":"2017-06-18T22:44:21Z","timestamp":1497825861000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5196022\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,6]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/iolts.2009.5196022","relation":{},"subject":[],"published":{"date-parts":[[2009,6]]}}}