{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T12:16:55Z","timestamp":1725538615359},"reference-count":17,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,7]]},"DOI":"10.1109\/iolts.2010.5560231","type":"proceedings-article","created":{"date-parts":[[2010,9,7]],"date-time":"2010-09-07T16:30:39Z","timestamp":1283877039000},"page":"77-82","source":"Crossref","is-referenced-by-count":2,"title":["Built-in performance monitoring of mixed-signal\/RF front ends using real-time parameter estimation"],"prefix":"10.1109","author":[{"given":"Shyam Kumar","family":"Devarakond","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shreyas","family":"Sen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Aritra","family":"Banerjee","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vishwanath","family":"Natarajan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Abhijit","family":"Chatterjee","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2009.31"},{"key":"ref11","first-page":"534","article-title":"DFT & On-lin Test of High Performance Data Converters: Practical Case","author":"peralias","year":"1998","journal-title":"International Test Conference"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1994.292304"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.8"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.1999.808563"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.874272"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2006.43"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1214\/aos\/1176347963"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cdt:20060145"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1995.529939"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2004.1347843"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.880592"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/54.990438"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2005.30"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/CSICS.2005.1531828"},{"article-title":"Distortion in RF Power Amplifiers","year":"2003","author":"vuolevi","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/54.735927"}],"event":{"name":"2010 IEEE 16th International On-Line Testing Symposium (IOLTS 2010)","start":{"date-parts":[[2010,7,5]]},"location":"Corfu, Greece","end":{"date-parts":[[2010,7,7]]}},"container-title":["2010 IEEE 16th International On-Line Testing Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5550907\/5560185\/05560231.pdf?arnumber=5560231","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T20:40:13Z","timestamp":1489869613000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5560231\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,7]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/iolts.2010.5560231","relation":{},"subject":[],"published":{"date-parts":[[2010,7]]}}}