{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T21:02:02Z","timestamp":1725656522808},"reference-count":27,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,7]]},"DOI":"10.1109\/iolts.2010.5560235","type":"proceedings-article","created":{"date-parts":[[2010,9,7]],"date-time":"2010-09-07T20:30:39Z","timestamp":1283891439000},"page":"49-55","source":"Crossref","is-referenced-by-count":8,"title":["Analysis of on-line self-testing policies for real-time embedded multiprocessors in DSM technologies"],"prefix":"10.1109","author":[{"given":"O.","family":"Heron","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.","family":"Guilhemsang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"N.","family":"Ventroux","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Giulieri","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2003.1253179"},{"key":"ref11","first-page":"196","article-title":"DIY A: a reliable substrate for deep sub micron microarchitecture design","author":"austin","year":"1999","journal-title":"Micro"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2008.3"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/1168857.1168868"},{"year":"2008","key":"ref14","article-title":"Semiconductor Reliability Handbook"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/1216544.1216545"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/1403375.1403590"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700583"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1023\/A:1008244815697"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2002.1003802"},{"key":"ref4","doi-asserted-by":"crossref","first-page":"338","DOI":"10.1145\/775832.775920","article-title":"Parameter variations and impact on circuits and microarchitecture","author":"borkar","year":"2003","journal-title":"DAC"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1145\/1687399.1687436"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2004.24"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2006.243983"},{"key":"ref5","first-page":"205","article-title":"Impact of deep sub micron technology on dependability of VLSI circuits","author":"constantinescu","year":"2002","journal-title":"IEEE DSN"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/1346281.1346314"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/2.56849"},{"key":"ref2","first-page":"1322","article-title":"Emerging yield and reliability challenges in nanometer CMOS technologies","author":"gielen","year":"2008","journal-title":"ACM DATE"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"111","DOI":"10.1145\/545214.545228","article-title":"ReVive: cost-effective architectural support for rollback recovery in shared-memory multiprocessors","author":"prvulovic","year":"2002","journal-title":"Int Symp on Computer Architecture"},{"year":"2003","key":"ref1","article-title":"Critical Reliability Challenges for the International Technology Roadmap for Semiconductors"},{"article-title":"Principles of testing electronic systems","year":"2000","author":"mourad","key":"ref20"},{"article-title":"Computer architecture: a quantitative approach","year":"2003","author":"hennessy","key":"ref22"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2008.2000866"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1978.1675148"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/EMRTS.1999.777467"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2004.1268907"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1145\/1882453.1882461"}],"event":{"name":"2010 IEEE 16th International On-Line Testing Symposium (IOLTS 2010)","start":{"date-parts":[[2010,7,5]]},"location":"Corfu, Greece","end":{"date-parts":[[2010,7,7]]}},"container-title":["2010 IEEE 16th International On-Line Testing Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5550907\/5560185\/05560235.pdf?arnumber=5560235","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,6,3]],"date-time":"2023-06-03T06:22:17Z","timestamp":1685773337000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5560235\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,7]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/iolts.2010.5560235","relation":{},"subject":[],"published":{"date-parts":[[2010,7]]}}}