{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T09:44:18Z","timestamp":1729676658919,"version":"3.28.0"},"reference-count":22,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,7]]},"DOI":"10.1109\/iolts.2011.5993849","type":"proceedings-article","created":{"date-parts":[[2011,8,25]],"date-time":"2011-08-25T16:44:00Z","timestamp":1314290640000},"page":"222-227","source":"Crossref","is-referenced-by-count":17,"title":["A side channel attack countermeasure using system-on-chip power profile scrambling"],"prefix":"10.1109","author":[{"given":"Armin","family":"Krieg","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Johannes","family":"Grinschgl","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Christian","family":"Steger","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Reinhold","family":"Weiss","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Josef","family":"Haid","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"Leon3 Processor","year":"2010","key":"19"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2011.5955001"},{"key":"17","first-page":"587","article-title":"Automated power characterization for run-time power emulation of SoC designs","author":"bachmann","year":"2010","journal-title":"DSD 2010"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2007.79"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1145\/1065579.1065764"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/ICSAMOS.2009.5289243"},{"key":"13","first-page":"135","article-title":"Correlation power analysis with a leakage model","author":"brier","year":"2004","journal-title":"Cryptographic Hardware and Embedded Systems-CHES"},{"journal-title":"Power Analysis Attacks Revealing the Secrets of Smart Cards","year":"2007","author":"mangard","key":"14"},{"key":"11","doi-asserted-by":"crossref","first-page":"513","DOI":"10.1007\/BFb0052259","article-title":"Differential fault analysis of secret key cryptosystems","author":"biham","year":"1997","journal-title":"Advances in CryptologyCRYPTO'97"},{"key":"12","article-title":"Differential power analysis","volume":"99","author":"kocher","year":"1999","journal-title":"Crypto"},{"journal-title":"OpenSCA An Open Source Toolbox for Matlab","year":"2010","author":"oswald","key":"21"},{"key":"3","first-page":"95","article-title":"Masking and dual-rail logic dont add up","author":"schaumont","year":"2007","journal-title":"Cryptographic Hardware and Embedded Systems-CHES"},{"journal-title":"Implementations of AES (Rjindael) in C\/C++ and Assembler","year":"2010","author":"gladman","key":"20"},{"key":"2","first-page":"1197","article-title":"A digital design flow for secure integrated circuits,\" Computer-Aided Design of Integrated Circuits and Systems","volume":"25","author":"tiri","year":"2006","journal-title":"IEEE Transactions on"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1145\/1015047.1015049"},{"journal-title":"Power Attack Resistant Cryptosystem Design A Dynamic Voltage and Frequency Switching Approach","year":"2005","author":"yang","key":"10"},{"key":"7","first-page":"489","article-title":"RIJID: Random code injection to mask power analysis based side channel attacks","author":"ambrose","year":"2007","journal-title":"Proceedings of the 42nd annual conference on Design automation"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2004.25"},{"key":"5","first-page":"218","article-title":"Current flattening in software and hardware for security applications","author":"muresan","year":"2005","journal-title":"Hardware\/Software Codesign and System Synthesis 2004 CODES + ISSS 2004 International Conference on"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1145\/1631716.1631717"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1145\/775844.775845"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2008.4681650"}],"event":{"name":"2011 IEEE 17th International On-Line Testing Symposium (IOLTS 2011)","start":{"date-parts":[[2011,7,13]]},"location":"Athens, Greece","end":{"date-parts":[[2011,7,15]]}},"container-title":["2011 IEEE 17th International On-Line Testing Symposium"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5979170\/5993790\/05993849.pdf?arnumber=5993849","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,20]],"date-time":"2017-06-20T01:12:20Z","timestamp":1497921140000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5993849\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,7]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/iolts.2011.5993849","relation":{},"subject":[],"published":{"date-parts":[[2011,7]]}}}