{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,5]],"date-time":"2025-07-05T00:32:23Z","timestamp":1751675543636},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,6]]},"DOI":"10.1109\/iolts.2012.6313833","type":"proceedings-article","created":{"date-parts":[[2012,10,9]],"date-time":"2012-10-09T18:14:18Z","timestamp":1349806458000},"page":"7-12","source":"Crossref","is-referenced-by-count":4,"title":["SETTOFF: A fault tolerant flip-flop for building Cost-efficient Reliable Systems"],"prefix":"10.1109","author":[{"family":"Yang Lin","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mark","family":"Zwolinski","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"15","first-page":"86","article-title":"Time redundancy based soft-error tolerance to rescue nanometer technologies","author":"nicolaidis","year":"1999","journal-title":"VLSI Test Symposium 1999 Proceedings 17th IEEE"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/ARES.2008.55"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2003.1253179"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2000.840845"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2007.1070"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2004.833308"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1979.19370"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.1980.1156060"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2007145"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/ICMMT.2007.381452"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cdt.2008.0099"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.181"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1986.1676803"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1147\/rd.282.0124"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/23.903815"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2005.1594099"}],"event":{"name":"2012 IEEE 18th International On-Line Testing Symposium (IOLTS 2012)","start":{"date-parts":[[2012,6,27]]},"location":"Sitges, Spain","end":{"date-parts":[[2012,6,29]]}},"container-title":["2012 IEEE 18th International On-Line Testing Symposium (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6304844\/6313830\/06313833.pdf?arnumber=6313833","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T19:09:19Z","timestamp":1490123359000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6313833\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,6]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/iolts.2012.6313833","relation":{},"subject":[],"published":{"date-parts":[[2012,6]]}}}