{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T01:02:07Z","timestamp":1729645327765,"version":"3.28.0"},"reference-count":20,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,6]]},"DOI":"10.1109\/iolts.2012.6313837","type":"proceedings-article","created":{"date-parts":[[2012,10,10]],"date-time":"2012-10-10T17:03:17Z","timestamp":1349888597000},"page":"31-36","source":"Crossref","is-referenced-by-count":2,"title":["Analyzing and alleviating the impact of errors on an SRAM-based FPGA cluster"],"prefix":"10.1109","author":[{"given":"Arwa Ben","family":"Dhia","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lirida","family":"Naviner","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Philippe","family":"Matherat","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.856487"},{"key":"17","doi-asserted-by":"crossref","first-page":"288","DOI":"10.1109\/TVLSI.2004.824300","article-title":"The effect of LUT and cluster size on deep-submicron FPGA performance and density","volume":"12","author":"ahmed","year":"2004","journal-title":"Very Large Scale Integration (VLSI) Systems IEEE Transactions on"},{"key":"18","doi-asserted-by":"crossref","first-page":"282","DOI":"10.1109\/DATE.2005.47","article-title":"Accurate reliability evaluation and enhancement via probabilistic transfer matrices","volume":"1","author":"krishnaswamy","year":"2005","journal-title":"Design Automation and Test in Europe 2005 Proceedings"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/RME.2006.1689902"},{"journal-title":"Placement Rent Exponent Calculation Methods","year":"2003","author":"pistorius","key":"16"},{"year":"0","key":"13"},{"journal-title":"Programmable Gate Array Switch Box and Logic Unit for Such An Array","year":"2010","author":"marrakchi","key":"14"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1145\/1046192.1046195"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1145\/1331897.1331902"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1145\/1095890.1095915"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2007.32"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2005.68"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2009.5195988"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/ICM.2008.5393494"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2008.4616787"},{"key":"6","doi-asserted-by":"crossref","first-page":"305","DOI":"10.1109\/DDECS.2010.5491763","article-title":"A novel SRAMbased FPGA architecture for defect and fault tolerance of configurable logic blocks","author":"lahrach","year":"2010","journal-title":"Design and Diagnostics of Electronic Circuits and Systems (DDECS) 2010 IEEE 13th International Symposium on"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2011.5993817"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2006.36"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4615-5145-4"},{"year":"0","key":"8"}],"event":{"name":"2012 IEEE 18th International On-Line Testing Symposium (IOLTS 2012)","start":{"date-parts":[[2012,6,27]]},"location":"Sitges, Spain","end":{"date-parts":[[2012,6,29]]}},"container-title":["2012 IEEE 18th International On-Line Testing Symposium (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6304844\/6313830\/06313837.pdf?arnumber=6313837","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,7,4]],"date-time":"2019-07-04T15:18:43Z","timestamp":1562253523000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6313837\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,6]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/iolts.2012.6313837","relation":{},"subject":[],"published":{"date-parts":[[2012,6]]}}}