{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T00:04:13Z","timestamp":1729641853838,"version":"3.28.0"},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,6]]},"DOI":"10.1109\/iolts.2012.6313844","type":"proceedings-article","created":{"date-parts":[[2012,10,9]],"date-time":"2012-10-09T18:14:18Z","timestamp":1349806458000},"page":"73-78","source":"Crossref","is-referenced-by-count":2,"title":["Do more camera pixels result in a better picture?"],"prefix":"10.1109","author":[{"given":"Glenn H.","family":"Chapman","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Israel","family":"Koren","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zahava","family":"Koren","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"crossref","DOI":"10.1117\/12.704563","article-title":"Identification of in-field defect development in digital image sensors","author":"dudas","year":"2007","journal-title":"Proc Electronic Imaging Digital Photography III v6502 65020Y1-0Y12"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2008.927662"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2007.908906"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2008.58"},{"journal-title":"Statistics in geography","year":"1985","author":"ebdon","key":"6"},{"journal-title":"Statistical Analysis of Spatial Patterns","year":"1983","author":"diggle","key":"5"},{"journal-title":"Measurement and Analysis of Defect Development in Digital Imagers","year":"2011","author":"leung","key":"4"},{"key":"8","article-title":"Tradeoffs in imager design parameters for sensor reliability","volume":"7875","author":"leung","year":"2011","journal-title":"Proc of Electronic Imaging Sensors Cameras and Systems for Industrial\/Scientific Application IX"}],"event":{"name":"2012 IEEE 18th International On-Line Testing Symposium (IOLTS 2012)","start":{"date-parts":[[2012,6,27]]},"location":"Sitges, Spain","end":{"date-parts":[[2012,6,29]]}},"container-title":["2012 IEEE 18th International On-Line Testing Symposium (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6304844\/6313830\/06313844.pdf?arnumber=6313844","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,20]],"date-time":"2017-06-20T21:11:50Z","timestamp":1497993110000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6313844\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,6]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/iolts.2012.6313844","relation":{},"subject":[],"published":{"date-parts":[[2012,6]]}}}