{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T01:24:19Z","timestamp":1725672259245},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,6]]},"DOI":"10.1109\/iolts.2012.6313849","type":"proceedings-article","created":{"date-parts":[[2012,10,9]],"date-time":"2012-10-09T18:14:18Z","timestamp":1349806458000},"page":"103-108","source":"Crossref","is-referenced-by-count":10,"title":["RIIF - Reliability information interchange format"],"prefix":"10.1109","author":[{"given":"Adrian","family":"Evans","sequence":"first","affiliation":[]},{"given":"Michael","family":"Nicolaidis","sequence":"additional","affiliation":[]},{"given":"Shi-Jie","family":"Wen","sequence":"additional","affiliation":[]},{"given":"Dan","family":"Alexandrescu","sequence":"additional","affiliation":[]},{"given":"Enrico","family":"Costenaro","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"year":"0","key":"3"},{"year":"0","key":"2"},{"journal-title":"Antlr v3","year":"0","author":"parr","key":"10"},{"journal-title":"Design and Analysis of Fault-Tolerant Digital Systems","year":"1989","author":"johnson","key":"1"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2011.5993833"},{"year":"0","key":"6"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2011.46"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2006.251220"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2009.5195997"},{"journal-title":"Case Study of Seu Effects in A Network Processor","year":"2012","author":"evans","key":"8"}],"event":{"name":"2012 IEEE 18th International On-Line Testing Symposium (IOLTS 2012)","start":{"date-parts":[[2012,6,27]]},"location":"Sitges, Spain","end":{"date-parts":[[2012,6,29]]}},"container-title":["2012 IEEE 18th International On-Line Testing Symposium (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6304844\/6313830\/06313849.pdf?arnumber=6313849","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T18:56:31Z","timestamp":1490122591000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6313849\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,6]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/iolts.2012.6313849","relation":{},"subject":[],"published":{"date-parts":[[2012,6]]}}}