{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T14:27:47Z","timestamp":1725546467912},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,6]]},"DOI":"10.1109\/iolts.2012.6313869","type":"proceedings-article","created":{"date-parts":[[2012,10,10]],"date-time":"2012-10-10T17:03:17Z","timestamp":1349888597000},"page":"182-187","source":"Crossref","is-referenced-by-count":10,"title":["Towards optimized functional evaluation of SEE-induced failures in complex designs"],"prefix":"10.1109","author":[{"given":"Dan","family":"Alexandrescu","sequence":"first","affiliation":[]},{"given":"Enrico","family":"Costenaro","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"year":"0","key":"19"},{"journal-title":"Outils Pour la Simulation des Fautes Transitoires","year":"2007","author":"alexandrescu","key":"17"},{"journal-title":"Floating Point Adder and Multiplier","year":"2012","key":"18"},{"key":"15","doi-asserted-by":"crossref","DOI":"10.1109\/OLT.2003.1214374","article-title":"Accurate and efficient analysis of single event transients in vlsi circuits","author":"reorda","year":"2003","journal-title":"Proceedings of the 9th IEEE International On-Line Testing Symposium"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1993.627334"},{"year":"2012","key":"13"},{"key":"14","first-page":"99","article-title":"New methods for evaluating the impact of single event transients in vdsm ics","author":"alexandrescu","year":"2002","journal-title":"Proc of DFT"},{"year":"2012","key":"11"},{"key":"12","first-page":"35","author":"bosio","year":"2008","journal-title":"LIFTING A Flexible Open-Source Fault Simulator"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/23.556861"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/23.736549"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.1975.4328188"},{"year":"2012","key":"10"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2003.1197722"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2009.2033915"},{"key":"5","first-page":"109","article-title":"A systematical method of quantifying seu fit","author":"shi-jie","year":"2008","journal-title":"IOLTS"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1584104"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1991.185327"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.858334"}],"event":{"name":"2012 IEEE 18th International On-Line Testing Symposium (IOLTS 2012)","start":{"date-parts":[[2012,6,27]]},"location":"Sitges, Spain","end":{"date-parts":[[2012,6,29]]}},"container-title":["2012 IEEE 18th International On-Line Testing Symposium (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6304844\/6313830\/06313869.pdf?arnumber=6313869","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,7,4]],"date-time":"2019-07-04T15:18:41Z","timestamp":1562253521000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6313869\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,6]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/iolts.2012.6313869","relation":{},"subject":[],"published":{"date-parts":[[2012,6]]}}}