{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T06:22:00Z","timestamp":1730269320063,"version":"3.28.0"},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,7]]},"DOI":"10.1109\/iolts.2013.6604051","type":"proceedings-article","created":{"date-parts":[[2013,9,25]],"date-time":"2013-09-25T18:04:12Z","timestamp":1380132252000},"page":"55-60","source":"Crossref","is-referenced-by-count":12,"title":["Timing vulnerability factors of sequential elements in modern microprocessors"],"prefix":"10.1109","author":[{"given":"Arkady","family":"Bramnik","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Andrei","family":"Sherban","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Norbert","family":"Seifert","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.855684"},{"key":"2","first-page":"99","article-title":"Radiation-induced Soft errors: A chip-level modeling perspective","volume":"4","year":"2010","journal-title":"Norbert Seifert Foundations and Trends in Electronic Design Automation"},{"key":"10","article-title":"Timing requirement for reliable latch-based circuit design","author":"jun lee","year":"2004","journal-title":"IMTC 2004-Instrumentation and Measurement Technology Conference"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.853449"},{"key":"7","article-title":"Case Study of SEU Effects in a Network Processor","author":"evans","year":"2012","journal-title":"SELSE Workshop (Silicon Errors in Logic-System Effects)"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2004.831993"},{"key":"5","article-title":"Architecture design for soft errors","author":"mukherjee","year":"2008","journal-title":"Morgan-Kaufmann"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.858334"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2010.5699209"},{"key":"8","first-page":"322","author":"weste","year":"1993","journal-title":"Principles of CMOS VLSI Design A System Perspective"}],"event":{"name":"2013 IEEE 19th International On-Line Testing Symposium (IOLTS)","start":{"date-parts":[[2013,7,8]]},"location":"Chania","end":{"date-parts":[[2013,7,10]]}},"container-title":["2013 IEEE 19th International On-Line Testing Symposium (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6589052\/6604040\/06604051.pdf?arnumber=6604051","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T19:01:07Z","timestamp":1490209267000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6604051\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,7]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/iolts.2013.6604051","relation":{},"subject":[],"published":{"date-parts":[[2013,7]]}}}