{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T02:02:56Z","timestamp":1725415376388},"reference-count":30,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,7]]},"DOI":"10.1109\/iolts.2013.6604075","type":"proceedings-article","created":{"date-parts":[[2013,9,25]],"date-time":"2013-09-25T18:04:12Z","timestamp":1380132252000},"page":"181-184","source":"Crossref","is-referenced-by-count":2,"title":["Measuring the performance impact of permanent faults in modern microprocessor architectures"],"prefix":"10.1109","author":[{"given":"Nikos","family":"Foutris","sequence":"first","affiliation":[]},{"given":"Dimitris","family":"Gizopoulos","sequence":"additional","affiliation":[]},{"given":"John","family":"Kalamatianos","sequence":"additional","affiliation":[]},{"given":"Vilas","family":"Sridharan","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2007.81"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.1991.1021597"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2009.5413171"},{"key":"15","article-title":"Memory systems: Cache, dram, disk","author":"jacob","year":"2008","journal-title":"Morgan Kaufmann"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1145\/2370816.2370837"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2009.5355594"},{"year":"0","key":"14"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2012.14"},{"key":"12","article-title":"A Methodology for Detecting Performance Faults in Microprocessor Speculative Execution Units via Hardware Performance Monitoring","author":"hatzimihail","year":"2007","journal-title":"ITC"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1109\/ISPASS.2006.1620790"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090716"},{"key":"22","article-title":"Combining branch predictors","author":"mcfarling","year":"1993","journal-title":"WRL Technical Note TN-36 Digital Equipment Corporation"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5456958"},{"key":"24","doi-asserted-by":"publisher","DOI":"10.1109\/12.214687"},{"key":"25","doi-asserted-by":"publisher","DOI":"10.1109\/12.210168"},{"key":"26","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2011.5994538"},{"key":"27","doi-asserted-by":"publisher","DOI":"10.1109\/12.21141"},{"key":"28","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.2008.22"},{"key":"29","doi-asserted-by":"publisher","DOI":"10.1145\/165123.165161"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2001.990303"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2004.840407"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1145\/2155620.2155666"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1145\/1669112.1669128"},{"key":"30","article-title":"PTLsim: A cycle Accurate Full System x86-64 Microarchitectural Simulator","author":"yourst","year":"2007","journal-title":"ISPASS"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2011.23"},{"key":"6","article-title":"Exploring impact of faults on Branch Predictor's Power for Diagnosis of FaultyModule","author":"bhattacharya","year":"2011","journal-title":"ATS"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1145\/1669112.1669127"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2003.1240894"},{"key":"9","article-title":"Shoestring: Probabilistic soft error reliability on the cheap","author":"feng","year":"2010","journal-title":"ASPLOS"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1145\/1669112.1669126"}],"event":{"name":"2013 IEEE 19th International On-Line Testing Symposium (IOLTS)","start":{"date-parts":[[2013,7,8]]},"location":"Chania","end":{"date-parts":[[2013,7,10]]}},"container-title":["2013 IEEE 19th International On-Line Testing Symposium (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6589052\/6604040\/06604075.pdf?arnumber=6604075","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T19:27:34Z","timestamp":1490210854000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6604075\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,7]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/iolts.2013.6604075","relation":{},"subject":[],"published":{"date-parts":[[2013,7]]}}}