{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T10:43:06Z","timestamp":1725446586338},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,7]]},"DOI":"10.1109\/iolts.2014.6873672","type":"proceedings-article","created":{"date-parts":[[2014,8,19]],"date-time":"2014-08-19T21:48:18Z","timestamp":1408484898000},"page":"55-61","source":"Crossref","is-referenced-by-count":1,"title":["A noise-tolerant master-slave flip-flop"],"prefix":"10.1109","author":[{"given":"Yukiya","family":"Miura","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yoshihiro","family":"Ohkawa","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2012.31"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2007145"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-009-5103-9"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2011.28"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2007.51"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2006.60"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2007.23"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2006.1594762"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2008.2000781"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2008.2000957"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2011.5784483"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/VLSISOC.2006.313256"},{"year":"1999","author":"gambles","key":"7"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1999.766651"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2008.2000772"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2005.70"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2003.1253179"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2009.5270340"}],"event":{"name":"2014 IEEE 20th International On-Line Testing Symposium (IOLTS)","start":{"date-parts":[[2014,7,7]]},"location":"Platja d'Aro, Girona, Spain","end":{"date-parts":[[2014,7,9]]}},"container-title":["2014 IEEE 20th International On-Line Testing Symposium (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6867432\/6873658\/06873672.pdf?arnumber=6873672","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T15:56:55Z","timestamp":1490284615000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6873672\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,7]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/iolts.2014.6873672","relation":{},"subject":[],"published":{"date-parts":[[2014,7]]}}}