{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T04:49:06Z","timestamp":1725425346616},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,7]]},"DOI":"10.1109\/iolts.2014.6873691","type":"proceedings-article","created":{"date-parts":[[2014,8,19]],"date-time":"2014-08-19T17:48:18Z","timestamp":1408470498000},"page":"184-185","source":"Crossref","is-referenced-by-count":1,"title":["Aging-aware critical paths in deep submicron"],"prefix":"10.1109","author":[{"given":"Phaninder","family":"Alladi","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Spyros","family":"Tragoudas","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386956"},{"key":"2","first-page":"98","author":"lu","year":"2004","journal-title":"Longest Path Selection for Delay Test under Process Variation ASP-DAC"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/ETC.1989.36234"},{"key":"1","first-page":"13","author":"wang","year":"2008","journal-title":"Statistical Prediction of Circuit Aging under Process Variations CICC"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.835137"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.839488(410) 24"},{"year":"0","key":"5"},{"year":"0","key":"4"},{"key":"9","first-page":"364","author":"wang","year":"2007","journal-title":"The Impact of NBTI on the Performance of Combinational and Sequential Circuits DAC"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.862751"},{"key":"11","first-page":"1","author":"bose","year":"2007","journal-title":"Delay Fault Simulation with Bounded Gate Delay Model ITC"},{"key":"12","first-page":"260","author":"hassoun","year":"2000","journal-title":"Critical Path Analysis Using Dynamically Bounded Delay Model"}],"event":{"name":"2014 IEEE 20th International On-Line Testing Symposium (IOLTS)","start":{"date-parts":[[2014,7,7]]},"location":"Platja d'Aro, Girona, Spain","end":{"date-parts":[[2014,7,9]]}},"container-title":["2014 IEEE 20th International On-Line Testing Symposium (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6867432\/6873658\/06873691.pdf?arnumber=6873691","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T15:43:59Z","timestamp":1490283839000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6873691\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,7]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/iolts.2014.6873691","relation":{},"subject":[],"published":{"date-parts":[[2014,7]]}}}