{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T06:22:07Z","timestamp":1730269327536,"version":"3.28.0"},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,7]]},"DOI":"10.1109\/iolts.2014.6873698","type":"proceedings-article","created":{"date-parts":[[2014,8,19]],"date-time":"2014-08-19T17:48:18Z","timestamp":1408470498000},"page":"206-209","source":"Crossref","is-referenced-by-count":0,"title":["An innovative standard cells remapping method for in-circuit critical parameters monitoring"],"prefix":"10.1109","author":[{"given":"Loic","family":"Welter","sequence":"first","affiliation":[]},{"given":"Philippe","family":"Dreux","sequence":"additional","affiliation":[]},{"given":"Hassen","family":"Aziza","sequence":"additional","affiliation":[]},{"given":"Jean-Michel","family":"Portal","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"Specifications for the Data Encryption Standard (DES)-FIPS PUB 46-3","year":"1999","key":"3"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2008.920300"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/DTIS.2014.6850657"},{"journal-title":"The Human ECO Compiler","year":"2004","author":"golson","key":"7"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/ICMTS.2011.5976854"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2013.6604061"},{"key":"4","first-page":"373","volume":"150","author":"mcloone","year":"2003","journal-title":"High-performance FPGA Implementation of des Using a Novel Method for Implementing the Key Schedule"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS.2007.4510926"}],"event":{"name":"2014 IEEE 20th International On-Line Testing Symposium (IOLTS)","start":{"date-parts":[[2014,7,7]]},"location":"Platja d'Aro, Girona, Spain","end":{"date-parts":[[2014,7,9]]}},"container-title":["2014 IEEE 20th International On-Line Testing Symposium (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6867432\/6873658\/06873698.pdf?arnumber=6873698","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,23]],"date-time":"2017-03-23T15:43:55Z","timestamp":1490283835000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6873698\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,7]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/iolts.2014.6873698","relation":{},"subject":[],"published":{"date-parts":[[2014,7]]}}}