{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,7]],"date-time":"2024-09-07T17:00:33Z","timestamp":1725728433894},"reference-count":24,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,7]]},"DOI":"10.1109\/iolts.2015.7229849","type":"proceedings-article","created":{"date-parts":[[2015,8,31]],"date-time":"2015-08-31T21:47:56Z","timestamp":1441057676000},"page":"150-155","source":"Crossref","is-referenced-by-count":12,"title":["Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currents"],"prefix":"10.1109","author":[{"given":"Clement","family":"Champeix","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nicolas","family":"Borrel","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jean-Max","family":"Dutertre","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bruno","family":"Robisson","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mathieu","family":"Lisart","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alexandre","family":"Sarafianos","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2006.103"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/RADECS.2007.5205469"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-013-5364-1"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2013.6532028"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IPFA.2013.6599120"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2013.6653598"},{"key":"ref16","article-title":"Characterization and simulation of a body biased structure in triple-well technology under pulsed photoelectric laser stimulation","author":"borrel","year":"2014","journal-title":"Proc Int Symp for Testing and Failure Analysis (ISTFA)"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2013.07.069"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2013.2252176"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2014.07.151"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.1965.4323904"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.853449"},{"key":"ref6","first-page":"2","article-title":"Optical fault induction attacks","author":"skorobogatov","year":"2002","journal-title":"4th International Workshop on Cryptographic Hardware and Embedded Systems ser CHES '02"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2255312"},{"key":"ref8","article-title":"An Efficient BICS Design for SEUs Detection and Correction in Semiconductor Memories","author":"gill","year":"0","journal-title":"Design Automation and Test in Europe Conference and Exhibition (DATE) 2005"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2012.2188769"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/23.556861"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.1975.4328188"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1994.315652"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/CCECE.2010.5575124"},{"key":"ref22","doi-asserted-by":"crossref","DOI":"10.1109\/SBCCI.2012.6344422","article-title":"by using Modular Built-In Current Sensors","author":"torres","year":"2012","journal-title":"25th Symposium on Integrated Circuits and Systems Design (SBCCI)"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2008.01.002"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2013.6581565"},{"key":"ref23","first-page":"1","article-title":"A Bulk Built-in Current Sensor for SET Detection with Dynamic Memory Cell","author":"simionovski","year":"2013","journal-title":"IEEE Latin American Symposium on Circuits and Systems (LASCAS"}],"event":{"name":"2015 IEEE 21st International On-Line Testing Symposium (IOLTS)","start":{"date-parts":[[2015,7,6]]},"location":"Halkidiki, Greece","end":{"date-parts":[[2015,7,8]]}},"container-title":["2015 IEEE 21st International On-Line Testing Symposium (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7217973\/7229816\/07229849.pdf?arnumber=7229849","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,23]],"date-time":"2017-06-23T18:39:56Z","timestamp":1498243196000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7229849\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,7]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/iolts.2015.7229849","relation":{},"subject":[],"published":{"date-parts":[[2015,7]]}}}