{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T23:03:51Z","timestamp":1725491031827},"reference-count":26,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,7]]},"DOI":"10.1109\/iolts.2015.7229851","type":"proceedings-article","created":{"date-parts":[[2015,8,31]],"date-time":"2015-08-31T17:47:56Z","timestamp":1441043276000},"page":"162-167","source":"Crossref","is-referenced-by-count":1,"title":["Flip-flop SEU reduction through minimization of the temporal vulnerability factor (TVF)"],"prefix":"10.1109","author":[{"given":"Adrian","family":"Evans","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Enrico","family":"Costenaro","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Arkady","family":"Bramnik","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.858334"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2012.6313869"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2009.5173251"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.13"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.882592"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2008.4479819"},{"key":"ref16","article-title":"Seat-la: a soft error analysis tool for combinational logic","author":"rajaramant","year":"0","journal-title":"VLSI Design 2006 Held Jointly with 5th International Conference on Embedded Systems and Design 19th International Conference on 2006"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-013-5385-9"},{"journal-title":"NANGATE","article-title":"The nangate 45nm open cell library","year":"2008","key":"ref18"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2013.6604051"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2008.15"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICICDT.2007.4299587"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2007.364501"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2010.24"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2004.831993"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2005.58"},{"key":"ref2","article-title":"Leap: Layout design through error-aware transistor positioning for soft-error resilient sequential cell design","author":"lee","year":"0","journal-title":"Reliability Physics Symposium (IRPS) 2010 IEEE International 2010"},{"journal-title":"Architecture Design for Soft Errors","year":"2008","author":"mukherjee","key":"ref9"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/23.556880"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2014.6873701"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/54.867894"},{"journal-title":"Gnu mixed integer linear programming solver","year":"2008","author":"berkelaar","key":"ref21"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2011.18"},{"journal-title":"Opencores","article-title":"Open cores web page","year":"2013","key":"ref23"},{"key":"ref26","doi-asserted-by":"crossref","DOI":"10.7873\/DATE2014.043","article-title":"Comprehensive analysis of alpha and neutron particle-induced soft errors in an embedded processor at nanoscales","author":"ebrahimi","year":"2014","journal-title":"Design Automation Test in Europe Conference Exhibition"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2013.6523691"}],"event":{"name":"2015 IEEE 21st International On-Line Testing Symposium (IOLTS)","start":{"date-parts":[[2015,7,6]]},"location":"Halkidiki, Greece","end":{"date-parts":[[2015,7,8]]}},"container-title":["2015 IEEE 21st International On-Line Testing Symposium (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7217973\/7229816\/07229851.pdf?arnumber=7229851","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,8,29]],"date-time":"2019-08-29T21:22:56Z","timestamp":1567113776000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7229851\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,7]]},"references-count":26,"URL":"https:\/\/doi.org\/10.1109\/iolts.2015.7229851","relation":{},"subject":[],"published":{"date-parts":[[2015,7]]}}}