{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,19]],"date-time":"2025-10-19T15:50:58Z","timestamp":1760889058844},"reference-count":23,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,7]]},"DOI":"10.1109\/iolts.2015.7229855","type":"proceedings-article","created":{"date-parts":[[2015,8,31]],"date-time":"2015-08-31T17:47:56Z","timestamp":1441043276000},"page":"176-181","source":"Crossref","is-referenced-by-count":10,"title":["Efficient observation point selection for aging monitoring"],"prefix":"10.1109","author":[{"given":"Chang","family":"Liu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Michael A.","family":"Kochte","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hans-Joachim","family":"Wunderlich","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/2429384.2429543"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2007145"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2007.23"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700619"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5457203"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5457131"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2014.6962092"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2011.246"},{"key":"ref18","first-page":"735","article-title":"An Efficient Method to Identify Critical Gates under Circuit Aging","author":"wang","year":"2007","journal-title":"Proc IEEE\/ACM Int'l Conf on Computer-Aided Design (ICCAD)"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2009.56"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2014.7035360"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ASICON.2009.5351352"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.917502"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2007.378339"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/2593069.2596682"},{"key":"ref7","first-page":"112","article-title":"tunable replica circuits and adaptive voltage-frequency techniques for dynamic voltage, temperature, and aging variation tolerance","author":"tschanz","year":"2009","journal-title":"2009 Symposium on VLSI Circuits VLSIC"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2009.26"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/1403375.1403590"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"589","DOI":"10.7873\/DATE.2015.0940","article-title":"On-Line Prediction of NBTI-induced Aging Rates","author":"rafal baranowski","year":"2015","journal-title":"Design Automation Test in Europe Conference Exhibition (DATE)"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2013.6651924"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2001.935589"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.070"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2006.320885"}],"event":{"name":"2015 IEEE 21st International On-Line Testing Symposium (IOLTS)","start":{"date-parts":[[2015,7,6]]},"location":"Halkidiki, Greece","end":{"date-parts":[[2015,7,8]]}},"container-title":["2015 IEEE 21st International On-Line Testing Symposium (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7217973\/7229816\/07229855.pdf?arnumber=7229855","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,8,29]],"date-time":"2019-08-29T21:22:56Z","timestamp":1567113776000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7229855\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,7]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/iolts.2015.7229855","relation":{},"subject":[],"published":{"date-parts":[[2015,7]]}}}