{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T12:32:10Z","timestamp":1725798730697},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,7]]},"DOI":"10.1109\/iolts.2016.7604678","type":"proceedings-article","created":{"date-parts":[[2016,10,24]],"date-time":"2016-10-24T16:24:50Z","timestamp":1477326290000},"page":"90-95","source":"Crossref","is-referenced-by-count":12,"title":["On-line write margin estimator to monitor performance degradation in SRAM cores"],"prefix":"10.1109","author":[{"given":"B.","family":"Alorda","sequence":"first","affiliation":[]},{"given":"C.","family":"Carmona","sequence":"additional","affiliation":[]},{"given":"G.","family":"Torrens","sequence":"additional","affiliation":[]},{"given":"S.","family":"Bota","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","first-page":"458","article-title":"A process-Variation-Tolerant Dual Power Supply SRAM with 0.179 um2 Cel in 40nm CMOS using level-programmable wordline driver","author":"hirabayashi","year":"2009","journal-title":"IEEE International Solid-State Circuits Conference"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2015.2462319"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2010.2096112"},{"key":"ref13","doi-asserted-by":"crossref","DOI":"10.7873\/DATE2014.174","article-title":"Word-line power supply selector for stability improvement of embedded SRAMs in high reliability applications","author":"alorda","year":"2014","journal-title":"Design Automation and Test in Europe Conference"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2014.2360035"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2012.6479099"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2014.6861171"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2014.2360779"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.892153"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2013.6604046"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2032698"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2009.03.016"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2014.05.009"},{"key":"ref9","article-title":"Online Measurement of degradation due to bias temperature instability in SRAMs","author":"ahmed","year":"2015","journal-title":"IEEE Transactions on Very Large Scale Integration (VLSI) Systems"}],"event":{"name":"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)","start":{"date-parts":[[2016,7,4]]},"location":"Sant Feliu de Guixols, Spain","end":{"date-parts":[[2016,7,6]]}},"container-title":["2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7589476\/7604654\/07604678.pdf?arnumber=7604678","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,9,14]],"date-time":"2019-09-14T20:06:57Z","timestamp":1568491617000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7604678\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,7]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/iolts.2016.7604678","relation":{},"subject":[],"published":{"date-parts":[[2016,7]]}}}