{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,26]],"date-time":"2025-11-26T16:25:37Z","timestamp":1764174337752},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,7]]},"DOI":"10.1109\/iolts.2016.7604685","type":"proceedings-article","created":{"date-parts":[[2016,10,24]],"date-time":"2016-10-24T16:24:50Z","timestamp":1477326290000},"page":"130-132","source":"Crossref","is-referenced-by-count":4,"title":["Advanced double-sampling architectures"],"prefix":"10.1109","author":[{"given":"Michael","family":"Nicolaidis","sequence":"first","affiliation":[]},{"given":"Michael","family":"Dimopoulos","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2003.1253179"},{"article-title":"Circuit Logique protégé contre des perturbations transitoires","year":"2000","author":"nicolaidis","key":"ref3"},{"journal-title":"Icyflex2 user manual CSEM","year":"0","key":"ref10"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2007148"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2004.85"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2014.2388358"},{"key":"ref7","article-title":"ADDA: Adaptive Double-sampling Architecture for Highly Flexible Robust Design”: section in the paper “Reliability challenges of real-time systems in forthcoming technology nodes","author":"nicolaidis","year":"2013","journal-title":"Said Hamdioui Michael Nicolaidis Dimitris Gizopoulos Arnaud Grasset Groeseneken Guido Philippe Bonnot Design Automation and Test in Europe Conference (DATE)"},{"key":"ref2","doi-asserted-by":"crossref","DOI":"10.1109\/VTEST.1999.766651","article-title":"Time Redundancy Based Soft-Error Tolerant Circuits to Rescue Very Deep Submicron","author":"nicolaidis","year":"1999","journal-title":"17th IEEE VLSI Test Symposium"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437666"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/12.656082"}],"event":{"name":"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)","start":{"date-parts":[[2016,7,4]]},"location":"Sant Feliu de Guixols, Spain","end":{"date-parts":[[2016,7,6]]}},"container-title":["2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7589476\/7604654\/07604685.pdf?arnumber=7604685","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,24]],"date-time":"2017-06-24T21:59:15Z","timestamp":1498341555000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7604685\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,7]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/iolts.2016.7604685","relation":{},"subject":[],"published":{"date-parts":[[2016,7]]}}}