{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,28]],"date-time":"2025-09-28T20:32:09Z","timestamp":1759091529210,"version":"3.28.0"},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,7]]},"DOI":"10.1109\/iolts.2016.7604711","type":"proceedings-article","created":{"date-parts":[[2016,10,24]],"date-time":"2016-10-24T16:24:50Z","timestamp":1477326290000},"page":"245-250","source":"Crossref","is-referenced-by-count":1,"title":["A hybrid self-diagnosis mechanism with defective nodes locating and attack detection for parallel computing systems"],"prefix":"10.1109","author":[{"given":"Lake","family":"Bu","sequence":"first","affiliation":[]},{"given":"Mark","family":"Karpovsky","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/11889700_16"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2008.13"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.sysarc.2006.09.007"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2004.1311880"},{"key":"ref4","first-page":"1","article-title":"A bit-interleaved embedded hamming scheme to correct single-bit and multi-bit upsets for sram-based fpgas","author":"venkataraman","year":"2013","journal-title":"24th FPL InternationalConference"},{"key":"ref3","article-title":"Scaling the memory reliability wall","volume":"17","author":"wilkerson","year":"2013","journal-title":"Intel Technology Journal"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2015.7229859"},{"key":"ref5","article-title":"Automated reasoning: Essays in honor of woody bledsoe","volume":"1","author":"boyer","year":"2012","journal-title":"Springer Science & Business Media"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2003.819332"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/12.262119"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1147\/rd.144.0390"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1145\/2133806.2133822"},{"key":"ref9","article-title":"Replacing linear hamming codes by robust nonlinear codes results in a reliability improvement of memories","author":"zhen","year":"2009","journal-title":"InternationalConference on Dependable Systems and Networks"}],"event":{"name":"2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)","start":{"date-parts":[[2016,7,4]]},"location":"Sant Feliu de Guixols, Spain","end":{"date-parts":[[2016,7,6]]}},"container-title":["2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7589476\/7604654\/07604711.pdf?arnumber=7604711","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2016,11,16]],"date-time":"2016-11-16T09:55:29Z","timestamp":1479290129000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7604711\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,7]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/iolts.2016.7604711","relation":{},"subject":[],"published":{"date-parts":[[2016,7]]}}}