{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T00:05:29Z","timestamp":1725494729527},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,7]]},"DOI":"10.1109\/iolts.2017.8046203","type":"proceedings-article","created":{"date-parts":[[2017,9,29]],"date-time":"2017-09-29T16:57:02Z","timestamp":1506704222000},"page":"100-105","source":"Crossref","is-referenced-by-count":8,"title":["Variation tolerant BTI monitoring in SRAM cells"],"prefix":"10.1109","author":[{"given":"Yiorgos","family":"Sfikas","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yiorgos","family":"Tsiatouhas","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2016.7604678"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2007.369932"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2017.7968221"},{"key":"ref13","article-title":"Bias Temperature Instability Analysis of FinFET Based SRAM cells","author":"khan","year":"2014","journal-title":"Proc Design and Test in Europe (DATE) Conf"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2015.2500900"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2164300"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2016.7753284"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IRWS.2007.4469217"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2014.2"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-014-5444-x"},{"key":"ref2","first-page":"11.1","article-title":"Characterization of NBTI induced Temporal Performance Degradation $i$n Nano-Scale SRAM array using IDDQ","author":"kang","year":"2007","journal-title":"IEEE International Test Conference (ITC)"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2008.4558900"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-DAT.2012.6212587"}],"event":{"name":"2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)","start":{"date-parts":[[2017,7,3]]},"location":"Thessaloniki, Greece","end":{"date-parts":[[2017,7,5]]}},"container-title":["2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8030509\/8046164\/08046203.pdf?arnumber=8046203","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,12,13]],"date-time":"2017-12-13T14:45:33Z","timestamp":1513176333000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8046203\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,7]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/iolts.2017.8046203","relation":{},"subject":[],"published":{"date-parts":[[2017,7]]}}}