{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,30]],"date-time":"2024-10-30T06:22:24Z","timestamp":1730269344518,"version":"3.28.0"},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,7]]},"DOI":"10.1109\/iolts.2017.8046204","type":"proceedings-article","created":{"date-parts":[[2017,9,29]],"date-time":"2017-09-29T20:57:02Z","timestamp":1506718622000},"page":"106-112","source":"Crossref","is-referenced-by-count":0,"title":["Dynamic aging compensation and Safety measures in Automotive environment"],"prefix":"10.1109","author":[{"given":"S.","family":"Mhira","sequence":"first","affiliation":[]},{"given":"V.","family":"Huard","sequence":"additional","affiliation":[]},{"given":"A.","family":"Benhassain","sequence":"additional","affiliation":[]},{"given":"F.","family":"Cacho","sequence":"additional","affiliation":[]},{"given":"S.","family":"Naudet","sequence":"additional","affiliation":[]},{"given":"A.","family":"Jain","sequence":"additional","affiliation":[]},{"given":"C.","family":"Parthasarathy","sequence":"additional","affiliation":[]},{"given":"A.","family":"Bravaix","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"IEEE International Reliability Physics Symposium","year":"2011","author":"kwasnick","key":"ref4"},{"journal-title":"IEEE Journal of Solid-State Circuits","year":"1974","author":"dennard","key":"ref3"},{"journal-title":"IEEE International Reliability Physics Symposium","year":"2013","author":"huard","key":"ref10"},{"journal-title":"IEEE Custom Integrated Circuits Conference","year":"2015","author":"benhassain","key":"ref6"},{"year":"0","key":"ref11"},{"journal-title":"IEEE International Reliability Physics Symposium","year":"2017","author":"huard","key":"ref5"},{"journal-title":"IEEE International Reliability Physics Symposium","year":"2013","author":"mintarno","key":"ref8"},{"journal-title":"Proceedings of the IEEE\/ACM DATE conference","year":"2015","author":"saliva","key":"ref7"},{"journal-title":"ITRS","year":"2010","key":"ref2"},{"journal-title":"IEEE International Reliability Physics Symposium","year":"2013","author":"huard","key":"ref9"},{"key":"ref1","volume":"38","author":"moore","year":"1965","journal-title":"Electronics"}],"event":{"name":"2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)","start":{"date-parts":[[2017,7,3]]},"location":"Thessaloniki, Greece","end":{"date-parts":[[2017,7,5]]}},"container-title":["2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8030509\/8046164\/08046204.pdf?arnumber=8046204","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,10,27]],"date-time":"2017-10-27T21:51:38Z","timestamp":1509141098000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8046204\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,7]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/iolts.2017.8046204","relation":{},"subject":[],"published":{"date-parts":[[2017,7]]}}}