{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,28]],"date-time":"2025-10-28T10:07:48Z","timestamp":1761646068497},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,7]]},"DOI":"10.1109\/iolts.2017.8046213","type":"proceedings-article","created":{"date-parts":[[2017,9,29]],"date-time":"2017-09-29T20:57:02Z","timestamp":1506718622000},"page":"169-173","source":"Crossref","is-referenced-by-count":2,"title":["Jamming resistant encoding for non-uniformly distributed information"],"prefix":"10.1109","author":[{"given":"Batya","family":"Karp","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yerucham","family":"Berkowitz","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Osnat","family":"Keren","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","article-title":"Robust error detection in communication and computational channels","author":"karpovsky","year":"2007","journal-title":"Spectral Methods and Multirate Signal Processing SMMSP'2007 2007 International Workshop on"},{"journal-title":"Self-Checking and Fault-Tolerant Digital Design","year":"2001","author":"lala","key":"ref3"},{"key":"ref10","first-page":"30","article-title":"Security-oriented state assignment","author":"shumsky","year":"2013","journal-title":"Workshop on Trustworthy Manufacturing and Utilization of Secure Devices TRUDEVICE 2013"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/EEEI.2012.6376995"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2014.2377151"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2014.6962084"},{"journal-title":"Input","year":"0","author":"leijten","key":"ref12"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-78967-3_27"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2014.2310464"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2012.2188769"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2013.146"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-71829-3"}],"event":{"name":"2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)","start":{"date-parts":[[2017,7,3]]},"location":"Thessaloniki, Greece","end":{"date-parts":[[2017,7,5]]}},"container-title":["2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8030509\/8046164\/08046213.pdf?arnumber=8046213","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,12,13]],"date-time":"2017-12-13T19:43:22Z","timestamp":1513194202000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8046213\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,7]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/iolts.2017.8046213","relation":{},"subject":[],"published":{"date-parts":[[2017,7]]}}}